Kaito Takashi | SII Nano Technology Inc., 36-1 Takenoshita, Oyama, Shizuoka 410-1393, Japan
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概要
- Kaito Takashiの詳細を見る
- 同名の論文著者
- SII Nano Technology Inc., 36-1 Takenoshita, Oyama, Shizuoka 410-1393, Japanの論文著者
関連著者
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Kaito Takashi
SII Nano Technology Inc., 36-1 Takenoshita, Oyama, Shizuoka 410-1393, Japan
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KAITO Takashi
SII Nano Technology Inc.
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KAITO Takashi
SII NanoTechnology Inc.
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Matsui Shinji
Graduate School Of Science And Laboratory Of Advanced Science And Technology For Industry Himeji Ins
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Kanda Kazuhiro
Graduate School Of Science And Laboratory Of Advanced Science And Technology For Industry Himeji Ins
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Haruyama Yuichi
Graduate School Of Science And Laboratory Of Advanced Science And Technology For Industry Himeji Ins
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Kanda Kazuhiro
University Of Hyogo Laboratory Of Advanced Science And Technology For Industry
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Kometani Reo
Graduate School Of Engineering The University Of Tokyo
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Matsui Shinji
University Of Hyogo
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Haruyama Yuichi
University of Hyogo, Graduate School of Science, Laboratory of Advanced Science and Technology for Industry (LASTI), 3-1-2 Koto, Kamigori, Hyogo 678-1205, Japan
著作論文
- Fabrication of Nanomanipulator with SiO_2/DLC Heterostructure by Focused-Ion-Beam Chemical Vapor Deposition
- Fabrication of Diamond-Like Carbon Nanosprings by Focused-Ion-Beam Chemical Vapor Deposition and Evaluation of Their Mechanical Characteristics(Micro/Nano Fabrication,Microoptomechatronics)
- Deposition Yield and Physical Properties of Carbon Films Deposited by Focused-Ion-Beam Chemical Vapor Deposition
- Nanostructure Analysis of Nanosprings Fabricated by Focused-Ion-Beam Chemical Vapor Deposition
- Elastic Double Structure of Amorphous Carbon Pillar Grown by Focused-Ion-Beam Chemical Vapor Deposition
- Examination of Focused-Ion-Beam Repair Resolution for UV-Nanoimprint Templates
- Eduction Position Control of Incorporated Gallium in Diamond-Like Carbon Deposited by Focused-Ion-Beam Chemical Vapor Deposition
- Relationship between Field Emission Properties and Material Characteristics of Diamond-Like Carbon Fabricated by Focused-Ion-Beam Chemical Vapor Deposition
- Evaluation of a Bio Nano-Sensing Probe Fabricated by Focused-Ion-Beam Chemical Vapor Deposition for Single Organelle Analyses
- Nanoimprint Mold Repair by Ga+ Focused-Ion-Beam Direct Etching