Tanaka Hiroyuki | Department of Electrical Engineering, Faculty of engineering Science, Osaka University
スポンサーリンク
概要
関連著者
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Tanaka Hiroyuki
Department of Electrical Engineering, Faculty of engineering Science, Osaka University
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小林 孝嘉
東京大学理学系研究科
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Yun Young
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Maki Tetsuro
Department Of Physical Science Graduate School Of Engineering Science Osaka University:core Research
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Maki Tetsuro
Graduate School Of Engineering Science Osaka University
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YUN Young
Semiconductor Device Research Center, Matsushita Electric Industrial Co., Ltd.
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Yun Young
Semiconductor Device Research Center Matsushita Electric Industrial Co. Ltd.
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Maki T
Osaka Univ. Osaka Jpn
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Tanaka Hiroyuki
Department Of Cardiology Kurashiki Central Hospital
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MAKI Tetsuro
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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KOBAYASHI Takeshi
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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Yun Young
Department Of Earth And Planetary Sciences School Of Science Tokyo Institute Of Technology
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Kobayashi Takeshi
Department Of Biological Chemistry College Of Bioscience And Biotechnology Chubu University
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Maki Tetsuro
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Tanaka Hiroyuki
Department Of Anesthesia And Clinical Research Institute National Hospital Organization Kyushu Medic
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SHIRAKAWA Yusuke
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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Ito A
Nihon Univ. Chiba Jpn
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Itoh Akihiro
Department Of Physical Science Graduate School Of Engineering Science Osaka University:core Research
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Shirakawa Y
Shizuoka Univ. Hamamatsu Jpn
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Hirashita N
Oki Electric Industry Co. Ltd. Vlsi R&d Center
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Hirashita Norio
Vlsi Research And Development Center Oki Electric Industry Co. Ltd.
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Hirashita Norio
Vlsi R&d Center Oki Electric Industry Co. Ltd.
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Sinclair Robert
Department of Materials Science and Engineering, Stanford University
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Shirakawa Yusuke
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Shirakawa Y
Tdk Corp. Chiba
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Sinclair R
Department Of Marerials Science And Engineering Stanford University
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Sinclair Robert
Department Of Materials Science And Engineering Stanford University
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TANAKA Hiroyuki
VLSI R&D Center, Oki Electric Industry Co., Ltd.
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Sinclair Robert
Department of Marerials Science and Engineering, Stanford University
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YUN Young
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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Tanaka Hiroyuki
Graduate School of Pharmaceutical Sciences, Kyushu University
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ITOH Akihiro
Department of Urology,Tohoku University School of Medicine
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Itoh Akihiro
Department Of Gastroenterology Nagoya University Graduate School Of Medicine
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ITO Akihiro
Graduate School of Engineering Science, Osaka University
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YUN Young
Graduate School of Engineering Science, Osaka University
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MAKI Tetsuro
Graduate School of Engineering Science, Osaka University
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KOBAYASHI Takeshi
Graduate School of Engineering Science, Osaka University
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Tanaka Hiroyuki
Graduate School Of Pharmaceutical Sciences Kyushu University
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ITOH Akihiro
Department of Gastroenterology and Hepatology, Nagoya University Graduate School of Medicine
著作論文
- Improved Stability of Metal-Insulator-Diamond Semiconductor Interface by Employing BaF_2 Insulator Film
- Electrical Properties of Al/(Ba_XCa_)F_2/i-Diamond Metal-Insulator-Semiconductor Structures
- Electrical Stabilization of Diamond MIS Interface by Employing BaF_2 Insulator Film and Application to Diamond MISFETs
- Highly Improved Electrical Properties of Diamond Metal-Insulator-Semiconductor Field-Effect-Transistor Prepared by Ultrahigh Vacuum Process
- Electrical Properties of Al/CaF_2/i-Diamond Metal-Insulator-Semiconductor Field-Effect-Transistor Fabricated by Ultrahigh Vacuum Process
- Highly Improved Electrical Properties of Diamond MISFET Prepared by Ultrahigh-Vacuum Process
- Electrical Properties of Metal-Insulator-Semiconductor (MIS) Interface and MISFETs Employing Hydrogenated Diamond Film Surface
- Kinetic Analysis of the C49-to-C54 Phase Transformation in TiSi_2 Thin Films by In Situ Observation
- In Situ Observation of the C49-to-C54 Phase Transformation in TiSi_2 Thin Films by Transmission Electron Microscopy