Shirakawa Y | Tdk Corp. Chiba
スポンサーリンク
概要
関連著者
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SHIRAKAWA Yusuke
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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Shirakawa Y
Shizuoka Univ. Hamamatsu Jpn
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Shirakawa Yusuke
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Shirakawa Y
Tdk Corp. Chiba
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小林 孝嘉
東京大学理学系研究科
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Tanaka Hiroyuki
Department Of Cardiology Kurashiki Central Hospital
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MAKI Tetsuro
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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KOBAYASHI Takeshi
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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Yun Young
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Yun Young
Department Of Earth And Planetary Sciences School Of Science Tokyo Institute Of Technology
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Kobayashi Takeshi
Department Of Biological Chemistry College Of Bioscience And Biotechnology Chubu University
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Maki Tetsuro
Department Of Physical Science Graduate School Of Engineering Science Osaka University:core Research
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Maki Tetsuro
Department Of Electrical Engineering Faculty Of Engineering Science Osaka University
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Maki Tetsuro
Graduate School Of Engineering Science Osaka University
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YUN Young
Semiconductor Device Research Center, Matsushita Electric Industrial Co., Ltd.
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Yun Young
Semiconductor Device Research Center Matsushita Electric Industrial Co. Ltd.
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Maki T
Osaka Univ. Osaka Jpn
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Tanaka Hiroyuki
Department Of Anesthesia And Clinical Research Institute National Hospital Organization Kyushu Medic
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Tanaka Hiroyuki
Department of Electrical Engineering, Faculty of engineering Science, Osaka University
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YUN Young
Department of Electrical Engineering, Faculty of Engineering Science, Osaka University
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Yano Yoshihiko
R&d Center Tdk Corporation
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YANO Yoshihiko
R&D Center, TDK Corporation
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SHIRAKAWA Yukihiko
R&D Center, TDK Corporation
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MOROOKA Hisao
R&D Center, TDK Corporation
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Morooka Hisao
R&d Center Tdk Corporation
著作論文
- Improved Stability of Metal-Insulator-Diamond Semiconductor Interface by Employing BaF_2 Insulator Film
- Deep-Level Transient Spectroscopy of Interface States in ZnO/PrCoO_x/ZnO Thin-Film Junctions
- Electrical Properties of Al/CaF_2/i-Diamond Metal-Insulator-Semiconductor Field-Effect-Transistor Fabricated by Ultrahigh Vacuum Process