Aoki Hidemitsu | Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
スポンサーリンク
概要
- Aoki Hidemitsuの詳細を見る
- 同名の論文著者
- Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japanの論文著者
関連著者
-
Aoki Hidemitsu
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Kimura Chiharu
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Sugino Takashi
Department Of Basic Pathology Fukushima Medical University
-
Watanabe Daisuke
Department of Applied Physics, Graduate School of Engineering, Tohoku University, Aoba-yama 05, Aoba-ku, Sendai 980-8579, Japan
-
Kimura Chiharu
Department Of Electrical Engineering Osaka University
-
Watanabe Daisuke
Department Of Dermatology Aichi Medical University
-
Jeong Jong-Hyeon
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Hotta Saori
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Ooi Naoki
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Aoki Hidemitsu
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Ooi Naoki
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Jong-Hyeon Jeong
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Kawase Yasuhiro
Semiconductor Materials Laboratories, Mitsubishi Chemical Corporation, Kitakyushu 806-0004, Japan
-
Hara Makoto
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka 565-0871, Japan
-
Ito Atsushi
Semiconductor Materials Laboratories, Mitsubishi Chemical Corporation, Kitakyushu 806-0004, Japan
-
Suzuki Toshiyuki
Semiconductor Materials Laboratories, Mitsubishi Chemical Corporation, Kitakyushu 806-0004, Japan
-
Sakae Rina
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka 565-0871, Japan
-
Sakata Takao
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
-
MASUI AKIHIKO
Technology Research Institute of Osaka Prefecture
-
FUJIWARA NOBUAKI
Technology Research Institute of Osaka Prefecture
-
YAMANAKA Koji
Organo Corporation
-
Taniguchi Takashi
National Institute For Materials Science
-
Watanabe Kenji
National Inst. Materials Sci. (nims) Ibaraki Jpn
-
Masumoto Keiko
Department Of Electrical Electronic And Information Engineering Osaka University
-
Tsuchida Hidekazu
Materials Science Research Laboratory Central Research Institute Of Electric Power Industry (criepi)
-
Masumoto Keiko
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Semba Akitoshi
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Aoki Hidemitsu
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Aoki Hidemitsu
Department of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
-
Aoki Hidemitsu
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Hidemitsu Aoki
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Jong-Hyeon Jeong
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Jeong Jong-Hyeon
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Jeong Jong-Hyeon
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Kubo Eitaro
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Daisuke Watanabe
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Chiharu Kimura
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Takashi Sugino
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Miyano Kazuki
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Hotta Saori
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Yano Daisaku
Organo Corporation, 4-4-1 Nishionuma, Sagamihara, Kanagawa 229-0012, Japan
-
Sano Kazuhiko
Organo Corporation, 4-4-1 Nishionuma, Sagamihara, Kanagawa 229-0012, Japan
-
Kimura Chiharu
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Kimura Chiharu
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Kimura Chiharu
Department of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
-
Mazumder Motaharul
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Moriyama Ryota
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Kimura Chiharu
Department of Electrical, Electronic and Information Engineering, Osaka University, Suita, Osaka 565-0871, Japan
-
Tsuchida Hidekazu
Materials Science Research Laboratory, Central Research Institute of Electric Power Industry, Yokosuka, Kanagawa 240-0196, Japan
-
Nakayama Koji
Power Engineering R&D Center, Kansai Electric Power Co., Inc., Amagasaki, Hyogo 661-0974, Japan
-
Sugawara Yoshitaka
Power Engineering R&D Center, Kansai Electric Power Co., Inc., Amagasaki, Hyogo 661-0974, Japan
-
Sugawara Yoshitaka
Power Engineering R&D Center, Kansai Electric Power Co., Inc., Amagasaki, Hyogo 661-0974, Japan
-
Sugino Takashi
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Sugino Takashi
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Sugino Takashi
Department of Electrical, Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Harada Ken
Semiconductor Materials Laboratories, Mitsubishi Chemical Corporation, Kitakyushu 806-0004, Japan
-
Watanabe Daisuke
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
-
Watanabe Daisuke
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Yamanaka Koji
Organo Corporation, 4-4-1 Nishionuma, Sagamihara, Kanagawa 229-0012, Japan
-
Kumeta Kazuhiro
Nitivy Corporation, 1-2 Kyobashi 3-chome, Chuo-ku, Tokyo 104-0031, Japan
-
Eitaro Kubo
Department of Electrical Electronic and Information Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan
-
Fujiwara Nobuaki
Technology Research Institute of Osaka Prefecture, 2-7-1 Ayumino, Izumi, Osaka 594-1157, Japan
-
Taniguchi Takashi
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
-
Watanabe Kenji
National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
-
Hata Yasuto
Nitivy Corporation, 1-2 Kyobashi 3-chome, Chuo-ku, Tokyo 104-0031, Japan
-
原田 研
Semiconductor Materials Laboratories, Mitsubishi Chemical Corporation, Kitakyushu 806-0004, Japan
著作論文
- Luminescence Characteristics and Annealing Effect of Tb-Doped AlBNO Films for Inorganic Electroluminescence Devices
- Ag Diffusion in Low-$k$ Materials (BCN and SiOC) and Its Challenges for Future Interconnection
- Drift Phenomena of Forward and Reverse Recovery Characteristics in {0001} 4H-SiC p--i--n Diode
- Effect of Light Irradiation on Galvanic Corrosion of Metal Gate
- Rapid and Highly Sensitive Detection of Bacteria Sensor Using a Porous Ion Exchange Film
- Selective Sensing of Multi-Inorganic Ions Using Ion Exchange Fiber Film
- Effect of Magnetic Field on Permeability of Electroplated Permalloy for Microdevices
- Galvanic Corrosion Suppression of High-$k$/Metal Gates Using Organic Solvent-Based Hydrogen Fluoride
- Electrochemical Etching of Ru Film for Bevel Cleaning of Back End of Line
- Cu Electroplating Process with Magnetic Field for Flexible Device
- Study of Cu-Inhibitor State for Post-Chemical Mechanical Polishing Cleaning
- 電子線干渉法による磁性材料観察