Moritani A | Department Of Electronic And Control System Eng. Shimane University
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概要
関連著者
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Moritani A
Department Of Electronic And Control System Eng. Shimane University
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Moritani Akihiro
Department Of Electronic And Control System Eng. Shimane University
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Nakai J
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Nakai Junkichi
Department Of Electronics Faculty Of Engineering Osaka University
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Nakai Junkichi
Deparimsnt Of Elecironics Facully Of Engineering Osaka University
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MORITANI Akihiro
Department of Electronic and Control Systems Engineering, Shimane University
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Moritani Akihiro
Department of Electronics, Faculty of Engineering, Osaka University
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Hamaguchi Chihiro
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Hamaguchi Chihiro
Deparimsnt Of Elecironics Facully Of Engineering Osaka University
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NAKAI Junkichi
Department of Electronics, Osaka University
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TANIGUCHI Kenji
Department of Cancer Research, Fuji Gotemba Research Laboratories, Chugai and Pharmaceutical Co
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TACHIKAWA Akiyoshi
Advanced Technology Research Laboratories, Nippon Steel Corporation
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Taniguchi Kenji
Department Of Electronics Osaka University
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Jono Aiji
Advanced Technology Research Laboratories Nippon Steel Corporation
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Aigo T
Advanced Technology Research Laboratories Nippon Steel Corporation
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MORITANI Akihiro
Advanced Technology Research Laboratories, Nippon Steel Corporation
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Tachikawa A
Nippon Steel Corp. Kanagawa Jpn
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Taniguchi Kenji
Department Of Biotechnology Tottori University
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Aigo Takashi
Advanced Semiconductor Materials And Devices Laboratories Nippon Steel Corporation
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Misawa Kiyotoshi
Department Of Electronics Faculty Of Engineering Osaka University
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Moritani Akihiro
Department Of Electronics Faculty Of Engineering Osaka University
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Tachikawa Akiyoshi
Advanced Semiconductor Materials And Devices Laboratories Nippon Steel Corporation
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Yokogawa Masamichi
Department Of Electronics Faculty Of Engineering Osaka University:(present Address)sumitomo Electric
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Yokogawa Masamichi
Department Of Electronics Faculty Of Engineering Osaka University
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NAKAI Junkichi
Department of Electronics, Faculty of Engineering, Osaka University
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Moritani Akihiro
Advanced Semiconductor Materials and Devices Laboratories,
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後藤 誠
北陸職業能力開発大学校
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NAKAJIMA Kazuo
Institute for Materials Research (IMR), Tohoku University
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KUROSAWA Toshiyuki
Bruker AXS
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Goto M
Matsushita Electric Industrial Co.
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SEKIYA Hideki
Department of Oral Surgery, Toho University, Omori Medical Center
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MORIKAWA Yoji
Advanced Technology Research Laboratories, Nippon Steel Corp.
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GOTO Masashi
Matsushita Electric Industrial Co.
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IKEMATSU Yoichi
Advanced Technology Laboratories, Nippon Steel Corp.
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OHTSUKI Osamu
Fujitsu Laboratories Ltd.
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Akiyama Masahiro
Semiconductor Technology Laboratory Oki Electric Industry Co. Ltd.
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AIGO Takashi
Electronics Research Laboratories, Nippon Steel Corporation
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YASHIRO Hirokatsu
Electronics Research Laboratories, Nippon Steel Corporation
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GOTO Mitsuhiko
Electronics Research Laboratories, Nippon Steel Corporation
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JONO Aiji
Electronics Research Laboratories, Nippon Steel Corporation
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TACHIKAWA Akiyoshi
Electronics Research Laboratories, Nippon Steel Corporation
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MORITANI Akihiro
Electronics Research Laboratories, Nippon Steel Corporation
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Kitahara K
Interdisciplinary Faculty Of Science And Engineering Shimane University
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Kitahara Kuninori
Department Of Electronic And Control Systems Engineering Shimane University
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Ueda Yoichi
Fujitsu Laboratories
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Ueda Yoichi
Fujitsu Labolatories Ltd.
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Ohtsuki Osamu
Fujitsu Labolatories Ltd.
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Morikawa Yoji
Advanced Technology Research Laboratories Nippon Steel Corporation
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Sekiya Hideki
Department Of Electronics Osaka University
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Nakajima Kunio
Seiko Instrumentsu Inc.
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Futagi Toshiro
Advanced Technology Research Laboratories Nippon Steel Corporation
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Yashiro Hirokatsu
Advanced Technology Research Laboratories, Nippon Steel Corporation
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KUROSAWA Toshitaka
Komatsu Ltd.
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YAMAZAKI Ryosuke
Department of Electronic and Control System Eng., Shimane University
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MAKABE Ryoji
Government Industrial Research Institute
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UEDA Ryuiti
Fujitsu Labolatories Ltd.
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Nakai Junkichi
Department Of Electronic Engineering Osaka University
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Sano Yoshiaki
Semiconductor Technology Laboratory Research & Development Group Oki Electric Industry Co. Ltd.
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Sano Yoshiaki
Semiconductor Technology Laboratory Oki Electric Industry Co. Ltd.
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YAMAGISHI Chouho
Semiconductor Technology Laboratory, Oki Electric Industry Co., Ltd.
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SHIRAKAWA Tsuguru
Department of Electronic Engineering, Faculty of Engineering, Osaka University
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YOKOGAWA Masamichi
Department of Electronics,Faculty of Engineering,Osaka University
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Ikematsu Yoichi
Advanced Technology Research Laboratories Nippon Steel Corporation
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Yamagishi Chouho
Semiconductor Technology Laboratory Oki Electric Industry Co. Ltd.
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Shirakawa Tsuguru
Department Of Electronic Engineering Faculty Of Engineering Osaka University
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Kitahara Kuninori
Department Of Electronic And Control System Eng. Shimane University
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OIMURA Katsuhiko
Department of Electronic Engineering, Osaka University
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Oimura Katsuhiko
Department Of Electronic Engineering Osaka University
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Moritani Akihiro
Department Of Electronic Engineering Osaka University
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Yamazaki Ryosuke
Department Of Electronic And Control System Eng. Shimane University
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Yashiro Hirokatsu
Advanced Technology Research Laboratories Nippon Steel Corporation
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Nakajima Kazuo
Institute For Materials Research (imr) Tohoku University
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MURAKAMI Akihiko
Department of Electronics, Faculty of Engineering, Osaka University
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Nakajima Kazuo
Institute For Materials Research. Tohoku University
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Nakajima Kazuo
Institute for Materials Reseach, Tohoku University, 2-1-1 Katahira-cho, Aoba-ku, Sendai 980-8577, Japan
著作論文
- Thermal Resistance and Electrornic Characteristics for High Electron Mobility Transistors Grown on Si and GaAs Substrates by Metal-Organic Chemical Vapor Deposition
- Analysis of Stress in Laser-Crystallized Polysilicon Thin Films by Raman Scattering Spectroscopy
- Electroreflectance Study of Cd_xHg_Te
- Optical Constants of HgTe and HgSe
- Electroreflectance Measurements on Cd_xHg_Te
- Improvement of Threshold Voltage Uniformity in Ion-Implanted GaAs-Metal-Semiconductor Field-Effect Transistors on Si
- Phonon-Assisted Tunneling in Metal-Oxide-Pb_Sn_xTe Junctions
- Electroreflectance for the Λ_3-Λ_1 Transitions in HgSe
- Measurement of Carrier Concentration at the GaAs-Si Interface in GaAs on Si by Raman Scattering
- Electroreflectance of Anodized n-GaAs MOS
- Electrostriction and Piezoelectricity of Thermally Grown SiO_2 and Sputtered SiO_2 Films
- Electroreflectance of Si-MOS
- Observation of Conductance Anomalies in Pb-SiO_2-Au Tunnel Junctions