KUROSAWA Toshitaka | Komatsu Ltd.
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概要
関連著者
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KUROSAWA Toshitaka
Komatsu Ltd.
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KUROSAWA Toshiyuki
Bruker AXS
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FUNAKUBO Hiroshi
Department of Innovative and Engineered Materials, Interdisciplinary Graduate School, Tokyo Institut
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SAITO Keisuke
Application Laboratory
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Saito Keisuke
Application Laboratory Analytical Division Philips Japan Ltd.
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Saito K
Institute Of Industrial Science University Of Tokyo
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Funakubo Hiroshi
Department Of Innovative And Engineered Materials
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Fujisawa Hironori
Department Of Electrical Electronic And Computer Engineering Graduate School Of Engineering Hitneji
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Katoh Yoshihiro
Interdisciplinary Faculty Of Science And Engineering Shimane University
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Kitahara K
Interdisciplinary Faculty Of Science And Engineering Shimane University
著作論文
- Impact of 90゚-Domain Wall Motion in Pb(Zr_Ti_)O_3 Film on the Ferroelectricity Induced by an Applied Electric Field
- Analysis of Defects in Polycrystalline Silicon Thin Films Using Raman Scattering Spectroscopy
- Analysis of Stress in Laser-Crystallized Polysilicon Thin Films by Raman Scattering Spectroscopy
- Role of Non-180° Domain Switching in Electrical Properties of Pb(Zr_, Ti)O_3 Thin Films
- Analysis of Defects in Polycrystalline Silicon Thin Films Using Raman Scattering Spectroscopy