Ohashi Naofumi | Device Development Center Hitachi Ltd.
スポンサーリンク
概要
関連著者
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Ohashi Naofumi
Device Development Center Hitachi Ltd.
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Endou Akira
Department of Applied Chemistry, Graduate School of Engineering, Tohoku University
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MIYAMOTO Akira
Department of Applied Chemistry, Graduate School of Engineering, Tohoku University
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Kubo Momoji
Department Of Molecular Chemistry And Engineering Tohoku University
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Kubo Momoji
Department Of Applied Chemistry Graduate School Of Engineering Tohoku University
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TAKAMI Seiichi
Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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Miyamoto Akira
Department Of Applied Chemistry Graduate School Of Engineering Tohoku University
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Takami Seiichi
Department Of Chemical System Engineering Faculty Of Engineering The University Of Tokyo
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Endou Akira
Department Of Applied Chemistry Graduate School Of Engineering Tohoku University
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OHASHI Naofumi
Semiconductor Leading Edge Technologies, Inc.
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OHASHI Nobumoto
Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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Ohashi Nobumoto
Department Of Materials Chemistry Graduate School Of Engineering Tohoku University
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OHASHI Nobumoto
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
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武田 健一
日立製作所 中央研究所
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Miyamoto A
New Ind. Creation Hatchery Center Tohoku Univ.
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Endou Akira
Dep. Of Applied Chemistry Graduate School Of Engineering Tohoku Univ.
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Takami S
Corporate Manufacturing Engineering Center Toshiba Corporation
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TERAISHI Kazuo
Department of Materials Chemistry, Graduate School of Engineering, Tohoku University
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BROCLAWIK Ewa
Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences
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Takeda Ken-ichi
Central Research Laboratory Hitachi Ltd.
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Kondo Seiichi
Central Research Laboratory Hitachi Ltd.
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Teraishi Kazuo
Department Of Materials And Chemistry Graduate School Of Engineering Tohoku University
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Hashimoto Takashi
Device Development Center, Hitachi, Ltd.
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NOGUCHI Junji
Micro Device Division, Hitachi, Ltd.
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YAMAGUCHI Hizuru
Renesas Technology Corp.
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YAMAGUCHI Hizuru
Device Development Center, Hitachi Ltd.
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NOGUCHI Junji
Hitachi, Ltd., Micro Device Division
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SAITO Tatsuyuki
Hitachi, Ltd., Micro Device Division
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MARUYAMA Hiroyuki
Hitachi, Ltd., Micro Device Division
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KUBO Maki
Hitachi, Ltd., Micro Device Division
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TAKEDA Ken-ichi
Hitachi, Ltd., Central Research Laboratory
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SAITO Tatsuyuki
Device Development Center, Hitachi Ltd.
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FUJIWARA Tsuyoshi
Device Development Center, Hitachi Ltd.
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Noguchi Junji
Device Development Center Hitachi Ltd.
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Yamaguchi Hizuru
Device Development Center Hitachi Ltd.
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Maruyama Hiroyuki
Hitachi Ltd. Micro Device Division
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Saito Tatsuyuki
Device Development Center Hitachi Ltd.
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SAKUMA Noriyuki
Central Research Laboratory, Hitachi, Ltd.
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HOMMA Yoshio
Central Research Laboratory, Hitachi, Ltd.
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YAJIMA Kenji
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
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YOSHIZAWA Kentaro
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
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Kubo Maki
Device Development Center Hitachi Ltd.
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Sakuma Noriyuki
Central Research Laboratory Hitachi Ltd.
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Ohashi N
Device Development Center Hitachi Ltd.
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Ohashi Naofumi
Semiconductor Leading Edge Technologies Inc.
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Homma Yoshio
Central Research Laboratory Hitachi Ltd.
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Yoshizawa Kentaro
Department Of Chemistry School Of Science The University Of Tokyo
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Fujiwara Tsuyoshi
Device Development Center Hitachi Ltd.
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Hashimoto Takashi
Device Development Center Hitachi Ltd.
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ENDOU Akira
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
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MIYAMOTO Akira
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
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TERAISHI Kazuo
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
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KUBO Momoji
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
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TAKAMI Seiichi
Department of Materials and Chemistry, Graduate School of Engineering, Tohoku University
著作論文
- Potential Energy Surface and Dynamics of Pd/MgO(001)System as Investigated by Periodic Density Functional Calculations and Classical Molecular Dynamics Simulations
- Dependence of Time-Dependent Dielectric Breakdown Lifetime on NH_3-Plasma Treatment in Cu Interconnects
- Dependence of Time-Dependent Dielectric Breakdown Lifetime on the Structure in Cu Metallization
- Copper Wires for High Speed Logic LSI Prepared by Low Pressure Long Throw Sputtering Method
- Slurry Chemical Corrosion and Galvanic Corrosion during Copper Chemical Mechanical Polishing
- Molecular Adsorption on Ultrafine Precious Metal Particles Studied by Density Functional Calculation