HUANG Heng-Sheng | Institute of Mechatronics Engineering, National Taipei Universityof Technology
スポンサーリンク
概要
関連著者
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HUANG Heng-Sheng
Institute of Mechatronics Engineering, National Taipei Universityof Technology
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Huang Heng-sheng
Institute Of Automation Technology National Taipei University Of Technology
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Hong G
Rodel‐nitta Co. Nara Jpn
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Huang H‐s
National Taipei Univ. Technol. Taipei Twn
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Chang C‐y
Department Of Electronics Engineering National Chiao Tung University
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Chang Chun-yen
Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Instiute Of Electronics National Chiao-tang University
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Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
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LIN Jyh-Kuang
Institute of Electronics, National Chiao Tung University
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Chen K‐l
United Microelectronics Corporation
著作論文
- A Capacitance Ratio Method Used for L_ Extraction of an Advanced Metal-Oxide-Semiconductor Device with Halo Implant
- A Modified Capacitance-Voltage Method Used for L_ Extraction and Process Monitoring in Advanced 0.15μm Complementary Metal-Oxide-Semiconductor Technology and Beyond
- The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
- The C-R Method Used for Leff Extraction and Process Optimization in Nano N/P-MOSFET's Devices
- New Polysilicon-Oxide-Nitride-Oxide-Silicon Electrically Erasable Programmable Read-only Memory Device Approach for Eliminating Off-Cell Leakage Current
- Behavior of Nano-N-Channel Metal-Oxide-Semiconductor Off-State Leakage Currents
- Charge Loss Due to AC Program Disturbance Stresses in EPROMs
- Trarnsient and Steady State Carrier Transport under High Field Stressesin SONOS EEPROM Device