Kumashiro S | Ulsi Device Development Division Nec Corporation
スポンサーリンク
概要
関連著者
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Kumashiro Shigetaka
Semiconductor Technology Academic Research Center
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Kumashiro S
Ulsi Device Development Division Nec Corporation
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Mattausch Hans
Hiroshima Univ. Higashihiroshima‐shi Jpn
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Mattausch Hans
Research Center For Nanodevices And Systems Hiroshima University
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Mattausch Hans
Hiroshima University
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Mattausch Hans
Research Institute For Nanodevice And Bio Systems Hiroshima University
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Miura‐mattausch M
Hiroshima Univ. Higashi‐hiroshima Jpn
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Miura-mattausch Mitiko
Hiroshima-university
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Ueno Hiroki
Department Of Electrical And Electronic Engineering Chuo University
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NAKAYAMA Noriaki
Tokyo Institute of Technology
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NAKAYAMA Noriaki
Institute for Chemical Research,Kyoto University
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Nakayama Noriaki
Semiconductor Technology Academic Research Center
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Ueno H
Graduate School Of Advanced Sciences Of Matter Hiroshima University:(present Address)matsushita Semi
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YAMAGUCHI Tetsuya
Semiconductor Technology Academic Research Center
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YAMASHITA Kyoji
Semiconductor Technology Academic Research Center
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Nakayama N
Department Of Advanced Materials Science And Engineering Faculty Of Engineering Yamaguchi University
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NAKAYAMA Noriaki
Semiconductor Technology Academic Research Center(STARC)
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Ueno Hiroaki
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Navarro Dondee
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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NAVARRO Dondee
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Tanaka M
Department Of Electronics & Computer Engineering Gifu-university
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OHGURO Tatsuya
Semiconductor Technology Academic Research Center
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Ohguro Tatsuya
Department Of Physics Faculty Of Science Hokkaido University
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Tanaka M
Department Of Electrical And Electronic Engineering Akita University
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Mizoguchi Takeshi
Semiconductor Technology Academic Research Center
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MIURA-MATTAUSCH Mitiko
Graduate School of Advanced Science of Matter, Hiroshima University
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HISAMITSU Kazuya
Graduate School of Advanced Sciences of Matter,Hiroshima University
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MATTAUSCH Mitiko
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Ohguro Tatsuya
Semiconductor Company Toshiba Corporation
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Matsumoto S
Semiconductor Technology Academic Research Center
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Hisamitsu Kazuya
Graduate School Of Advanced Sciences Of Matter Hiroshima University:(present Address)fujitsu Laborat
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MIURA MATTAUSCH
Graduate School of Advanced Sciences of Matter, Hiroshima University
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IIZUKA Takahiro
Semiconductor Technology Academic Research Center
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TAGUCHI Masahiko
Semiconductor Technology Academic Research Center
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MIYAMOTO Shunsuke
Semiconductor Technology Academic Research Center
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EZAKI Tatsuya
Graduate School of Advanced Science of Matter, Hiroshima University
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Kumashiro Shigetaka
Ulsi Device Development Laboratories Nec Corporation
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Nakayama Noriaki
Graduate School Of Advanced Science Of Matter Hiroshima University
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Morikawa Keiichi
Research Center For Nanodevices And Systems And Graduate School Of Advanced Sciences Of Matter Hiros
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Kawano Hiroaki
Graduate School Of Advanced Sciences Of Matter Hiroshima University:(present Address)matsushita Comm
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Ezaki Tatsuya
Graduate School Of Advanced Science Of Matter Hiroshima University
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TANAKA Masayasu
Graduate School of Advanced Science of Matter, Hiroshima University
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Hosokawa Satoshi
Graduate School Of Advanced Sciences Of Matter Hiroshima University:(present Address)ricoh Corporati
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YAMAOKA Takatoshi
Graduate School of Advanced Sciences of Matter,Hiroshima University
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MIZOGUCHI Takeshi
Graduate School of Advanced Sciences of Matter, Hiroshima University
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SUETAKE Masami
Graduate School of Advanced Sciences of Matter, Hiroshima University
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MATSUMOTO Shizunori
Graduate School of Advanced Sciences of Matter, Hiroshima University
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KITAMURA Toshihiko
Graduate School of Advanced Sciences of Matter, Hiroshima University
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UENO Hiroaki
Research Center for Nanodevices and Systems and Graduate School of Advanced Sciences of Matter, Hiro
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KITAMARU Daisuke
Research Center for Nanodevices and Systems and Graduate School of Advanced Sciences of Matter, Hiro
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TANAKA Masayasu
Research Center for Nanodevices and Systems and Graduate School of Advanced Sciences of Matter, Hiro
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OKAGAKI Takeshi
Research Center for Nanodevices and Systems and Graduate School of Advanced Sciences of Matter, Hiro
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MIURA-MATTAUSCHI Mitiko
Research Center for Nanodevices and Systems and Graduate School of Advanced Sciences of Matter, Hiro
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Suetake Masami
Graduate School Of Advanced Sciences Of Matter Hiroshima University:(present Address)jfe Steel Corpo
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TAKEDA Youichi
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Miura Mattausch
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Takeda Youichi
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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CHIBA Shingo
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Chiba Shingo
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Okagaki Takeshi
Research Center For Nanodevices And Systems And Graduate School Of Advanced Sciences Of Matter Hiros
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Ezaki Tatsuya
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Kitamaru Daisuke
Research Center For Nanodevices And Systems And Graduate School Of Advanced Sciences Of Matter Hiros
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Yamaoka Takatoshi
Graduate School Of Advanced Sciences Of Matter Hiroshima University:(present Address)yokogawa Denki
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Kitamura Toshihiko
Graduate School Of Advanced Sciences Of Matter Hiroshima University:(present Address)kyocera
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Kawano H
Ntt Telecommunication Networks Lab. Musashino‐shi Jpn
著作論文
- Circuit-Simulation Model of C_ Changes in Small-Size MOSFETs Due to High Channel-Field Gradients(the IEEE International Conference on SISPAD '02)
- A Compact Model of the Pinch-off Region of 100nm MOSFETs Based on the Surface-Potential(Semiconductor Materials and Devices)
- 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation(Semiconductor Materials and Devices)
- Quantum Effect in Sub-0.1μm MOSFET with Pocket Technologies and Its Relevance for the On-Current Condition
- Circuit Simulation Models for Coming MOSFET Generations(Special Section of Selected Papers from the 14th Workshop on Circuits and Systems in Karuizawa)
- MOSFET Harmonic Distortion up to the Cutoff Frequency : Measurement and Theoretical Analysis
- Advanced Process/Device Modeling and Its Ompact on the CMOS Design Solution (Special lssue on SISPAD'99)