MORI Hiroko | FUJITSU LSI Quality Assurance Div.
スポンサーリンク
概要
関連著者
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MORI Hiroko
FUJITSU LSI Quality Assurance Div.
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MATSUYAMA Hideya
FUJITSU LSI Quality Assurance Div.
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Tamura Naoyoshi
Fujitsu Lab. Ltd. Tokyo Jpn
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Tamura Naoyoshi
Fujitsu Laboratories Ltd.
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EHARA Hideo
FUJITSU LSI Quality Assurance Div.
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KANETA Chioko
FUJITSU Laboratories Ltd.
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SHONO Ken
FUJITSU LSI Quality Assurance Div.
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Satoh Shigeo
Fujitsu Laboratories Ltd.
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Kaneta Chioko
Fujitsu Laboratories Limited
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UEMURA Taiki
Fujitsu Laboratories Ltd.
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Tamura Naoyoshi
Fujitsu Lab. Ltd.
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Watanabe Satoru
Fujita Health University
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Mori Hiroko
Fujitsu Microelectronics Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan
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Matsuyama Hideya
Fujitsu Microelectronics Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan
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Ikeda Yoshihiro
Fujitsu Semiconductor Ltd., Akiruno Technology Center, Akiruno, Tokyo 197-0833, Japan
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Kato Takashi
Fujitsu Semiconductor Ltd., Akiruno Technology Center, Akiruno, Tokyo 197-0833, Japan
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Suzuki Kaina
Fujitsu Semiconductor Ltd., Akiruno Technology Center, Akiruno, Tokyo 197-0833, Japan
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Mori Hiroko
Fujitsu Semiconductor Ltd., Akiruno Technology Center, Akiruno, Tokyo 197-0833, Japan
著作論文
- Investigation of Degradation model for Ultra-thin Gate Dielectrics
- Generation of a New Interface State Associated with Ultrathin Gate Dielectrics/Silicon under Electric Stress
- Impact of Parasitic Bipolar Effect on Single-Event Upset in p-Type Metal--Oxide--Semiconductor Field Effect Transistor with Embedded SiGe