KANETA Chioko | FUJITSU Laboratories Ltd.

スポンサーリンク

概要

• KANETA Chiokoの詳細を見る
• 同名の論文著者
• FUJITSU Laboratories Ltd.の論文著者

関連著者

• KANETA Chioko

  FUJITSU Laboratories Ltd.

• Kaneta Chioko

  Fujitsu Laboratories Limited

• Tamura Naoyoshi

  Fujitsu Lab. Ltd. Tokyo Jpn

• Tamura Naoyoshi

  Fujitsu Laboratories Ltd.

• MORI Hiroko

  FUJITSU LSI Quality Assurance Div.

• EHARA Hideo

  FUJITSU LSI Quality Assurance Div.

• MATSUYAMA Hideya

  FUJITSU LSI Quality Assurance Div.

• SHONO Ken

  FUJITSU LSI Quality Assurance Div.

• TAKAHASHI Norihiko

  Fujitsu Laboratories Limited

• YAMASAKI Takahiro

  Fujitsu Laboratories Limited

• Tamura Naoyoshi

  Fujitsu Lab. Ltd.

もっと見る 閉じる

著作論文

• Investigation of Degradation model for Ultra-thin Gate Dielectrics
• Trap Generation Induced by Local Distortion in Amorphous Silicon Dioxide Film
• The Effect of Nitrogen on Thermal Diffusion in HfO_2-based Gate Dielectrics
• Hole Trapping Due to Impurities in Amorphous Silicon Dioxide

スポンサーリンク