Kaneta Chioko | Fujitsu Laboratories Limited

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概要

• KANETA Chiokoの詳細を見る
• 同名の論文著者
• Fujitsu Laboratories Limitedの論文著者

関連著者

• Kaneta Chioko

  Fujitsu Laboratories Limited

• KANETA Chioko

  FUJITSU Laboratories Ltd.

• YAMASAKI Takahiro

  Fujitsu Laboratories Limited

• Tamura Naoyoshi

  Fujitsu Lab. Ltd. Tokyo Jpn

• Tamura Naoyoshi

  Fujitsu Laboratories Ltd.

• MORI Hiroko

  FUJITSU LSI Quality Assurance Div.

• EHARA Hideo

  FUJITSU LSI Quality Assurance Div.

• MATSUYAMA Hideya

  FUJITSU LSI Quality Assurance Div.

• SHONO Ken

  FUJITSU LSI Quality Assurance Div.

• TERAKURA Kiyoyuki

  JRCAT-NAIR

• TAKAHASHI Norihiko

  Fujitsu Laboratories Limited

• Tamura Naoyoshi

  Fujitsu Lab. Ltd.

• UCHIYAMA Toshihiro

  JRCAT-ATP

• UDA Tsuyoshi

  JRCAT-ATP

• Terakura Kiyoyuki

  Jrcat Central 4:national Institute Of Advanced Industrial Science And Technology Research Institute

• Kaneta Chioko

  Fujitsu Laboratories Ltd., 10-1, Morinosato-Wakamiya, Atsugi 243-01, Japan

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著作論文

• Investigation of Degradation model for Ultra-thin Gate Dielectrics
• Trap Generation Induced by Local Distortion in Amorphous Silicon Dioxide Film
• The Effect of Nitrogen on Thermal Diffusion in HfO_2-based Gate Dielectrics
• Hole Trapping Due to Impurities in Amorphous Silicon Dioxide
• Interface States due to Intrinsic Defects in Si(100)/SiO_2
• Trap Generation Induced by Local Distortion in Amorphous Silicon Dioxide Film

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