YAMASAKI Takahiro | Fujitsu Laboratories Limited
スポンサーリンク
概要
関連著者
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Kaneta Chioko
Fujitsu Laboratories Limited
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YAMASAKI Takahiro
Fujitsu Laboratories Limited
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KANETA Chioko
FUJITSU Laboratories Ltd.
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TERAKURA Kiyoyuki
JRCAT-NAIR
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TAKAHASHI Norihiko
Fujitsu Laboratories Limited
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UCHIYAMA Toshihiro
JRCAT-ATP
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UDA Tsuyoshi
JRCAT-ATP
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Terakura Kiyoyuki
Jrcat Central 4:national Institute Of Advanced Industrial Science And Technology Research Institute
著作論文
- The Effect of Nitrogen on Thermal Diffusion in HfO_2-based Gate Dielectrics
- Interface States due to Intrinsic Defects in Si(100)/SiO_2