Liang Mong-song | R&d Department Taiwan Semiconductor Manufacturing Company
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概要
関連著者
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Liang Mong-song
R&d Department Taiwan Semiconductor Manufacturing Company
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Lin M‐s
Taiwan Semiconductor Manufacturing Company
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LIANG Mong-Song
Taiwan Semiconductor Manufacturing Co., Ltd.
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Liang Mong-song
Taiwan Semiconductor Manufacturing Co. Ltd.
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FANG Yean-Kuen
VLSI Technology Laboratory, Institute of Microelectronics, Department of Electrical Engineering, Nat
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Fang Y‐k
National Cheng Kung Univ. Taina Twn
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Fang Yean-kuen
Vlsi Technology Laboratory Electrical Engineering National Cheng Kung University
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Fang Yean-kuen
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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Fang Yean-kuen
Vlsi Technology Lab. Institute Of Microelectronics Ee Department National Cheng Kung University No.
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Liang M‐s
Taiwan Semiconductor Manufacturing Co. Hsinchu Twn
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HSIEH Jang-Cheng
Taiwan Memory Technology Inc.
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Hsieh Jang-cheng
Taiwan Semiconductor Manufacturing Company Ltd. Science-based Industrial Park
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LEE Kuei-Yi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
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Chen C‐w
Industrial Technol. Res. Inst. Hsinchu Twn
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Huang K‐c
National Chiao Tung Univ. Hsinchu Twn
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Liang Mong-song
Taiwan Semiconductor Manufacturing Company
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Su Chi-wen
R&d Department Taiwan Semiconductor Manufacturing Company
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Huang Kuo-ching
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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Lee K‐y
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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Lee Ki-young
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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YAUNG Dun-Nian
VLSI Technology Laboratory, Department of Electrical Engineering, National Cheng Kuang University
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LEE Kan-Yuan
VLSI Technology Laboratory, Department of Electrical Engineering, National Cheng Kuang University
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CHEN Chii-Wen
VLSI Technology Laboratory, Department of Electrical Engineering, National Cheng-Kung University
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LIANG Mong-Song
R&D Department, Taiwan Semiconductor Manufacturing Company, Science-Based Industrial Park
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Chen Jyh-huei
R&d Department Taiwan Semiconductor Manufacturing Company
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Hou Chin-shan
Institute Of Optical Sciences National Central University
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Yaung Dun-nian
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng Kuang University
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HUANG Huan-Tsung
Department of Electronics Engineering, National Chiao-Tung University
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CHEN Ming-Jer
Department of Electronics Engineering, National Chiao-Tung University
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SU Chi-Wen
R&D Department, Taiwan Semiconductor Manufacturing Company
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HOU Chin-Shan
R&D Department, Taiwan Semiconductor Manufacturing Company
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Huang Huan-tsung
Department Of Electronics Engineering National Chiao-tung University
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Chen Ming-jer
Department Of Electronics Engineering National Chiao-tung University
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Huang T‐y
National Chiao Tung Univ. Hsinchu Twn
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Chao T
National Chiao Tung Univ. Hsinchu Twn
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Chien C‐h
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Institute Of Electronics National Chiao Tung University
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Chang Chun-yen
Instiute Of Electronics National Chiao-tang University
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Chang Chun-yen
Department Of The Electro-optical Engineering National Chiao Tung University
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HUANG Tiao-Yuan
Institute of Electronics, National Chiao Tung University
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HUANG Tiao-Yuan
National Nano Device Laboratory
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Huang T-y
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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CHEN Chi-Chun
Institute of Elecrtonics, National Chiao Tung University
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LIN Homg-Chih
National Nano Device Laboratories
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CHAO Tien-Sheng
National Nano Device Laboratories
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University:national Nano Device Laboratories
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Huang Tiao-yuan
Institute Of Electronics National Chiao Tung University
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Chao T‐s
Department Of Electrophysics National Chiao Tung University
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Chao Tien
National Device Laboratory
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Lin H‐c
National Nano Device Laboratories
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Lin Horng-chih
Department Of Electronics Engineering And Institute Of Electronics National Chiao Tung University
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Lin Horng-chih
Institute Of Electronics National Chiao Tung University
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HWANG Kuo-Ching
VLSI Technology Laboratory, Department of Electrical Engineering, National Cheng Kuang University
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WUU Shou-Gwo
Taiwan Semiconductor Manufacturing Company
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LIN Mou-Shiung
Taiwan Semiconductor Manufacture Company
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Wang Jen-kwang
Opto-electronics & Systems Labs. Industrial Technology Research Institute
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Chang Chun-yen
Institute Of Electronics National Chiao Tang University:national Nano-device Laboratories
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LEE Gun-Yuan
VLSI Technology Laboratory, Department of Electrical Engineering, National Cheng-Kung University
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YOO Chue-San
Taiwan Semiconductor Manufacturing Co. Ltd.
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CHEN Jyh-Huei
R&D Department, Taiwan Semiconductor Manufacturing Company
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CHEN Jyh-Huei
Department of Electronics Engineering, National Chiao-Tung University
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Yoo Chue-san
R&D, Taiwan Semiconductor Manufacturing Co., Ltd.
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WU Chen-pao
R&D, Taiwan Semiconductor Manufacturing Co., Ltd.
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WANG Jen-kwang
R&D, Taiwan Semiconductor Manufacturing Co., Ltd.
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LIN Mou-shiun
R&D, Taiwan Semiconductor Manufacturing Co., Ltd.
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Lee Gun-yuan
Vlsi Technology Laboratory Department Of Electrical Engineering National Cheng-kung University
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Yoo C‐s
Taiwan Semiconductor Manufacturing Co. Ltd. Hisnchu Twn
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Wu Chen-pao
R&d Taiwan Semiconductor Manufacturing Co. Ltd.
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Lin Horng-chih
National Chiao Tung University
著作論文
- Plasma-Process-Induced Damage in Sputtered TiN Metal-Gate Capacitors with Ultrathin Nitrided Oxides
- A Comparison of Behaviors between Hydrogenated/Unhydrogenated Polysilicon Thin Film Transistors under Electric Stress
- Improvement on Fluorine Effect under High Field Stress in Tungsten-Polycide Gated Metal-Oxide-Semiconductor Field-Effect Transistor with Oxynitride and/or Reoxidized-Oxynitride Gate Dielectric
- Effects of Tungsten Polycide Process and Post-Polyoxidation Rapid Thermal Process on Electrical Characteristics of Thin Polysilicon Oxide
- Anomalous Current-Voltage Characteristics and Threshold Voltage Shift in Implanted-Polysilicon-Gated Complementary Metal-Oxide-Semiconductor Field-Effect Transistors with/without Titanium-Polycide Technology
- Monte Carlo Sphere Model for Effective Oxide Thinning Induced Extrinsic Breakdown
- Monte-Carlo Sphere Model for "Effective Oxide Thinning" Induced Extrinsic Breakdown
- A Novel Approach for Quantifying Contamination in Multiply Charged Implantation