Shiomi Hiromu | Sixon Ltd.
スポンサーリンク
概要
関連著者
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Shiomi Hiromu
Sixon Ltd.
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Hayashi Toshihiko
Sixon Ltd.
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Mori Taichiro
Department Of Materials Science And Engineering National Defense Academy
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Miyazaki Hisashi
Department Of Applied Physics Osaka City University
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Morimoto Jun
Department Of Applied Physics National Defense Academy
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MIYAZAKI Hisashi
Department of Physical Electronics, Tokyo Institute of Technology
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MORIMOTO Jun
Department of Materials Science and Engineering, National Defense Academy
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Morimoto J
Department Of Materials Science And Engineering National Defense Academy
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Passapong Wutimakun
Department of Materials Science and Engineering, National Defense Academy
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Mori Taichiro
Department of Materials Science and Engineering, National Defense Academy
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Hayashi Toshihiko
SiXON, Ltd.
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Passapong Wutimakun
Department Of Materials Science And Engineering National Defense Academy
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Okamoto Yoichi
Department Of Applied Physics National Defense Academy
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Shiomi Hiromu
SiXON, Ltd.
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Kinoshita Hiroyuki
SiXON Ltd., 47 Umezutakase-cho, Ukyo-ku, Kyoto 615-8686, Japan
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Kinoshita Hiroyuki
SiXON Ltd., 47 Umezu-Takase-cho, Ukyo-ku, Kyoto 615-8686, Japan
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KIMOTO Tsunenobu
Department of Electronic Science and Engineering, Kyoto University
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Matsunami H
Kyoto Univ. Kyoto Jpn
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Morimoto Jun
Department Of Materials Science And Engineering National Defense Academy
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MATSUNAMI Hiroyuki
Department of Electronic Science & Engineering, Kyoto University
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Tajima Michio
Institute Of Space And Astronautical Scienc
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Kimoto T
Kyoto Univ. Kyoto Jpn
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Amano Hiroshi
Department of Cardiology and Pneumology, Dokkyo University School of Medicine
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OKAMOTO Yoichi
Department of Materials Science and Engineering, National Defense Academy
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Akasaki Isamu
Department Of Electrical And Electronic Engineering And High-tech Research Center Meijo University
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FUJIHIRA Keiko
Department of Electronic Science and Engineering, Kyoto University
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Wutimakun Passapong
Department Of Industrial Engineering Chulachomklao Royal Military Academy
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IWAYA Motoaki
Department of Electrical and Electronic Engineering, Meijo University
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Kimoto Tsunenobu
Department Of Electrical Engineering Faculty Of Engineering Kyoto University
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Okamoto Y
Department Of Materials Science And Engineering National Defense Academy
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Fujihira K
Department Of Electronic Science And Engineering Kyoto University
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HONSHIO Akira
Department of Materials Science and Engineering, and Nano-factory, Meijo University
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KAMIYAMA Satoshi
Department of Materials Science and Engineering, and Nano-factory, Meijo University
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Matsunami Hiroyuki
Department Of Electrical Engineering Kyoto University
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Fujihira Keiko
Department Of Electronic Science And Engineering Kyoto University
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Kawashima Takeshi
Department Of Chemistry Shool Of Hygienic Sciences Kitasato University
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Matsunami Hiroyuki
Department Of Eectrical Engineering Kyoto University
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Miyake Yasuto
Department Of Electrical Electronic And Information Engineering Osaka University
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Akasaki Isamu
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Kasugai Hideki
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Mishima Shunsuke
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Iida Kazuyoshi
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Kasugai Hideki
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Honshio Akira
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Iwaya Motoaki
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Hayashi Toshihiko
SiXON Ltd., 47 Umezu-Takase-cho, Ukyo-ku, Kyoto 615-8686, Japan
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Hoshino Norihiro
Institute of Space and Astronautical Science/Japan Aerospace Exploration Agency, 3-1-1 Yoshinodai, Sagamihara, Kanagawa 229-8510, Japan
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Nishiguchi Taro
SiXON Ltd., 47 Umezu-Takase-cho, Ukyo-ku, Kyoto 615-8686, Japan
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Ikeda Keiichi
SiXON Ltd., 47 Umezu-Takase-cho, Ukyo-ku, Kyoto 615-8686, Japan
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Tajima Michio
Institute of Space and Astronautical Science/Japan Aerospace Exploration Agency, 3-1-1 Yoshinodai, Sagamihara, Kanagawa 229-8510, Japan
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Shiomi Hiromu
SiXON Ltd., 47 Umezutakase-cho, Ukyo-ku, Kyoto 615-8686, Japan
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Shiomi Hiromu
SiXON Ltd., 47 Umezu-Takasecho, Ukyo, Kyoto 615-0906, Japan
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Shiomi Hiromu
SiXON Ltd., 47 Umezu-Takase-cho, Ukyo-ku, Kyoto 615-8686, Japan
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Amano Hiroshi
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Iida Kazuyoshi
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Kamiyama Satoshi
Department of Materials Science and Engineering, 21st-Century COE Program "Nano Factory", Meijo University, 1-501 Shiogamaguchi, Tempaku-ku, Nagoya 468-8502, Japan
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Mori Taichiro
Department of Materials Science and Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan
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Miyazaki Hisashi
Department of Materials Science and Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan
著作論文
- P3-34 Nonradiative Recombination Process in Semi-insulating 6H-SiC Bulk Single Crystals Evaluated by Photoacoustic Spectroscopy(Poster session 3)
- P3-33 Thermal Diffusivity of Semi-Insulating 6H-SiC Single Crystal Wafers Evaluated by Photopyroelectric (PPE) Method(Poster session 3)
- High-Voltage 4H-SiC Schottky Barrier Diodes Fabricated on (033^^-8) with Closed Micropipes
- High-Efficiency Nitride-Based Light-Emitting Diodes with Moth-Eye Structure
- Nondestructive Analysis of Propagation of Stacking Faults in SiC Bulk Substrate and Epitaxial Layer by Photoluminescence Mapping
- Defect Distribution in N-Doped and Semi-Insulating 6H-SiC Bulk Single Crystal Wafers Observed by Two- and Three-Dimensional Light Scattering Tomography