Wutimakun Passapong | Department Of Industrial Engineering Chulachomklao Royal Military Academy

スポンサーリンク

概要

• 同名の論文著者
• Department Of Industrial Engineering Chulachomklao Royal Military Academyの論文著者

関連著者

• Wutimakun Passapong

  Department Of Industrial Engineering Chulachomklao Royal Military Academy

• Morimoto Jun

  Department Of Applied Physics National Defense Academy

• Miyazaki Hisashi

  Department Of Applied Physics Osaka City University

• MIYAZAKI Hisashi

  Department of Physical Electronics, Tokyo Institute of Technology

• WUTIMAKUN Passapong

  Department of Industrial Engineering, Chulachomklao Royal Military Academy

• LEE Kunyong

  Department of Materials Science and Engineering, National Defense Academy

• MORIMOTO Jun

  Department of Materials Science and Engineering, National Defense Academy

• Lee Kunyong

  Department Of Materials Science And Engineering National Defense Academy

• Shiomi Hiromu

  Sixon Ltd.

• Mori Taichiro

  Department Of Materials Science And Engineering National Defense Academy

• Hayashi Toshihiko

  Sixon Ltd.

• Miyazaki Hisashi

  Department Of Materials Science And Engineering National Defense Academy

• Toyoda Taro

  Department Of Applied Physics And Chemistry The University Of Electro-communications

• Okamoto Yoichi

  Department Of Applied Physics National Defense Academy

• Shiomi Hiromu

  SiXON Ltd., 47 Umezu-Takasecho, Ukyo, Kyoto 615-0906, Japan

• Mori Taichiro

  Department of Materials Science and Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan

• Miyazaki Hisashi

  Department of Materials Science and Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan

• Morimoto Jun

  Department of Materials Science and Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan

もっと見る 閉じる

著作論文

• Studies of Defect Detection and Thermal Influence in Semi-Insulating 6H-SiC Substrates Using a Long-Wavelength Infrared Thermal Imaging Camera
• Studies of Defects and Thermal Conductivity of Mixed Polytype in 6H-SiC Single Crystal by Polarized Optical Microscopy, Light Scattering Tomography, and Thermal Microscopy
• Defect Distribution in N-Doped and Semi-Insulating 6H-SiC Bulk Single Crystal Wafers Observed by Two- and Three-Dimensional Light Scattering Tomography

スポンサーリンク