Yang W | Hynix Semiconductor Inc. Kyoungki‐do Kor
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概要
関連著者
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Yang Woo
Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.
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Yeom S
Memory Research And Development Division Hynix Semiconductor Inc.
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Yeom S
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Yeom Seung
Memory Research And Development Division Hynix Semiconductor Inc.
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Yang W
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Yeom Seung
Memory R&d Division Hynix Semiconductor Inc.
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Yang Woo
Memory Research And Development Division Hynix Semiconductor Inc.
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YEOM Seung
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd.
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Kim Nam
Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.
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Kim N
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Kim Nam
Memory Research And Development Division Hynix Semiconductor Inc.
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Kim Nam
Memory Product And Technology Division Samsung Electronics
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Kim Nam
Memory R&d Division Hynix Semiconductor Inc.
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ROH Jae
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd.
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Roh J‐s
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Roh J
Memory Research And Development Division Hynix Semiconductor Inc.
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Roh Jae-sung
Advanced Process-capacitor Memory Research & Development Division Hyundai Electronics Industries
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KWEON Soon
Memory Research and Development Division, Hynix Semiconductor Inc.
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Roh Jae
Memory R & D Division Hynix Semiconductor Inc.
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Roh J‐s
Memory Research And Development Division Hynix Semiconductor Inc.
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Kweon Soon
Memory Research And Development Division Hynix Semiconductor Inc.
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Kweon Soon
Memory R&d Division Hynix Semiconductor Inc.
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Roh Jae-sung
Memory R&d Division Hynix Semiconductor Inc.
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Kim Chung
Memory Research And Development Division Hyundai Electronics Industries Co. Ltd.
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Yu Yong
Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.
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Lee Shang
Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.
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Lee Seok
School Of Materials Science And Engineering Seoul National University
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Lee S.k.
Display Device Research Lab. Lg Electronics Corp.
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Yu Y
Chunghwa Picture Tubes Ltd. Taoyuan Twn
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Kim Chung
Memory R&d Division Hyundai Electronics Co. Ltd.
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Choi E
Memory Research And Development Division Hynix Semiconductor Inc.
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KWEON Soon
Department of Materials Science and Engineering, Korea Advanced Institute of Science andTechnology
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CHOI Eun
Memory Research and Development Division, Hynix Semiconductor Inc.
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Choi S
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Choi Si
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Choi Eun
Memory R&d Division Hynix Semiconductor Inc.
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Kweon Soon
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1 Kusung-dong, Yusung-gu, Taejon 305-701, Korea
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CHOI Si
Department of Materials Science and Engineering, Korea Advanced Institute of Science andTechnology
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CHOl Si
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology
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YEON Seng
Memory R&D Division, Hyundai Electrontics Industries Co., Ltd.
著作論文
- Dependence of Switching Characteristics on Fabrication Process and Capacitor Size for Pt/SBT/Pt Ferroelectric Capacitor
- Dependence of Switching Characteristics on Fabrication Process and Capacitor Size for Pt/SBT/Pt Ferroelectric Capacitor
- Dependence of Switching Characteristics on Fabrication Process and Capacitor Size for Pt/SBT/Pt Ferroelectric Capacitor
- Electrical Properties of Bi_LaxTi_3O_ Ferroelectric Thin Films Prepared by Metalorganic Decomposition Method
- Stacked Pt/SrBi_2Ta_Nb_xO_9/Pt/IrO_x/Ir Capacitor on Poly Plug(Semiconductors)
- Effects of Bottom Electrodes (Pt and IrO_2) on Physical and Electrical Properties of Bi_La_xTi_3O_Thin Film : Electrical Properties of Condensed Matter
- Effects of Bottom Electrodes (Pt and IrO_2) on Physical and Electrical Properties of Bi_La_xTi_3O_ (BLT) Thin Film
- Thermal Stability and Electrical Properties of SrBi_2TaNb_XO_9/IrO_x Capacitors With Pt Top Electrode : Semiconductors
- Effects of Crystallization Annealing Sequence for SrBi_2Ta_2O_9(SBT)Film on Pt/SBT Interface Morphology and Electrical Properties of Ferroelectric Capacitor