Choi Si | Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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概要
- 同名の論文著者
- Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technologyの論文著者
関連著者
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Choi Si
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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KWEON Soon
Department of Materials Science and Engineering, Korea Advanced Institute of Science andTechnology
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Yeom Seung
Memory R&d Division Hynix Semiconductor Inc.
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Roh Jae
Memory R & D Division Hynix Semiconductor Inc.
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Kweon Soon
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1 Kusung-dong, Yusung-gu, Taejon 305-701, Korea
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YEOM Seung
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd.
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ROH Jae
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd.
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Yeom S
Memory Research And Development Division Hynix Semiconductor Inc.
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Roh J‐s
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Roh J
Memory Research And Development Division Hynix Semiconductor Inc.
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Roh Jae-sung
Advanced Process-capacitor Memory Research & Development Division Hyundai Electronics Industries
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Yeom S
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Yeom Seung
Memory Research And Development Division Hynix Semiconductor Inc.
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KWEON Soon
Memory Research and Development Division, Hynix Semiconductor Inc.
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Choi S
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Roh J‐s
Memory Research And Development Division Hynix Semiconductor Inc.
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Yang Woo
Memory Research And Development Division Hynix Semiconductor Inc.
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Kweon Soon
Memory Research And Development Division Hynix Semiconductor Inc.
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Kweon Soon
Memory R&d Division Hynix Semiconductor Inc.
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CHOI Si
Department of Materials Science and Engineering, Korea Advanced Institute of Science andTechnology
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Yang Woo
Memory Research and Development Division, Hyundai Electronics Industries Co., Ltd.
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Yang W
Hynix Semiconductor Inc. Kyoungki‐do Kor
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Roh Jae-sung
Memory R&d Division Hynix Semiconductor Inc.
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CHOl Si
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology
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Kim Chi
Department Of Dermatology College Of Medicine And Medical Research Institute Chungbuk National Unive
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Kim Yong
Department And Research Institute Of Rehabilitation Medicine Yonsei University College Of Medicine
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Park Chan
Department Of Anatomy College Of Medicine Kyung Hee University
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Roh Jae
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Korea
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Yeom Seung
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Korea
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Moon Mi-Hyoung
Department of Thoracic and Cardiovascular Surgery, Seoul St. Mary's Hospital, The Catholic University of Korea, Seoul, Republic of Korea
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Jeon Hyun
Department of Thoracic and Cardiovascular Surgery, Seoul St. Mary's Hospital, The Catholic University of Korea, Seoul, Republic of Korea
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Park Chan
Department of Thoracic and Cardiovascular Surgery, St. Paul's Hospital, The Catholic University of Korea College, College of Medicine, Seoul, Korea
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Yang Woo
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Korea
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Kim Yong
Department of Thoracic and Cardiovascular Surgery, Uijeongbu St. Mary's Hospital, The Catholic University of Korea, College of Medicine, Seoul, Korea.
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Jeon Hyun
Department of Thoracic and Cardiovascular Surgery, Seoul St. Mary's Hospital, The Catholic University of Korea, Seoul, Republic of Korea
著作論文
- Platinum Hillocks in Pt/Ti Film Stacks Deposited on Thermally Oxidized Si Substrate : Semiconductors
- Stacked Pt/SrBi_2Ta_Nb_xO_9/Pt/IrO_x/Ir Capacitor on Poly Plug(Semiconductors)
- Thermal Stability and Electrical Properties of SrBi_2TaNb_XO_9/IrO_x Capacitors With Pt Top Electrode : Semiconductors
- Thermal Stability and Electrical Properties of SrBi2Ta2-xNbxO9/IrOx Capacitors with Pt Top Electrode
- Spontaneous Rupture of Internal Iliac Artery Secondary to Anticoagulant Therapy