Yeom Seung | Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Korea
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概要
- Yeom Seung Jinの詳細を見る
- 同名の論文著者
- Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Koreaの論文著者
関連著者
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KWEON Soon
Department of Materials Science and Engineering, Korea Advanced Institute of Science andTechnology
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Yeom Seung
Memory R&d Division Hynix Semiconductor Inc.
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Choi Si
Department Of Materials Science And Engineering Korea Advanced Institute Of Science And Technology
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Roh Jae
Memory R & D Division Hynix Semiconductor Inc.
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Yang Woo
Memory Research And Development Division Hynix Semiconductor Inc.
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Roh Jae
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Korea
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Yeom Seung
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Korea
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Yang Woo
Memory Research and Development Division, HYUNDAI Electronics Industries Co., Ltd., San 136-1, Ami-ri, Bubal-eub, Ichon-si, Kyoungki-do 467-701, Korea
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Kweon Soon
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1 Kusung-dong, Yusung-gu, Taejon 305-701, Korea
著作論文
- Thermal Stability and Electrical Properties of SrBi2Ta2-xNbxO9/IrOx Capacitors with Pt Top Electrode