YANG Cary | Microelectronics Laboratory, Santa Clara University
スポンサーリンク
概要
関連著者
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YANG Cary
Microelectronics Laboratory, Santa Clara University
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Yang Cary
Microelectronics Lab. Santa Clara University
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INOKAWA Hiroshi
Microelectronics Laboratory, Santa Clara University
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GUPTA Ashawant
Microelectronics Laboratory, Santa Clara University
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Inokawa Hiroshi
Microelectronics Laboratory Santa Clara University:(present Address)ntt Lsi Laboratories
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Yang Cary
Microelectronics Laboratory Santa Clara University
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Yu Paul
Department Of Electrical And Computer Engineering University Of California
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Inokawa H
Ntt Lsi Lab. Kanagawa Jpn
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AJIMINE Eric
Microelectronics Laboratory, Santa Clara University
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Inokawa Hiroshi
Microelectronics Laboratory Santa Clara University:ntt Lsi Laboratories
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Pagaduan Felicia
Microelectronics Laboratory, Santa Clara University
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Nishida Takashi
Central Research Laboratory Hitachi Ltd.
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SUGIHARTO Dewi
Microelectronics Laboratory, Santa Clara University
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MATSUZAKI Nozomu
Central Research Laboratory, Hitachi, Ltd.
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MINAMI Masataka
Central Research Laboratory, Hitachi, Ltd.
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YAMANAKA Toshiaki
Central Research Laboratory, Hitachi, Ltd.
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NAGANO Takahiro
Central Research Laboratory, Hitachi, Ltd.
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Gupta Ashawant
Microelectronics Laboratory Santa Clara University
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Sim Sang-pil
Microelectronics Lab. Santa Clara University
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Lee Kwyro
Dept. Of Eecs And Micros Research Center Kaist
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Lee Kwyro
Dept. Of Eecs And Micros Research Center
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Lee Kwyro
Dept. Of Eecs Korea Advanced Institute Of Science And Technology (kaist)
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LIU Chun-Mai
Winbond Electronics Corporation of America
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MI Jian
Microelectronics Laboratory, Santa Clara University
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ZHU Jintian
Department of Electrical and Computer Engineering, University of California
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WARREN Patricia
Institute for Micro- and Optoelectronics, Department of Physics Swiss Federal Institute of Technolog
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DUTOIT Michel
Institute for Micro- and Optoelectronics, Department of Physics Swiss Federal Institute of Technolog
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Pagaduan Felicia
Microelectronics Laboratory Santa Clara University
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Mi Jian
Microelectronics Laboratory Santa Clara University
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Zhu Jintian
Department Of Electrical And Computer Engineering University Of California
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Dutoit Michel
Institute For Micro- And Optoelectronics Department Of Physics Swiss Federal Institute Of Technology
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Warren Patricia
Institute For Micro- And Optoelectronics Department Of Physics Swiss Federal Institute Of Technology
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Yang C
Microelectronics Laboratory Santa Clara University
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Liu Chun-mai
Winbond Electronics Corp. America
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Ajimine Eric
Microelectronics Laboratory Santa Clara University
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KORDESCH Al
Winbond Electronics Corp. America
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LEE Ben
Winbond Electronics Corp. America
著作論文
- Degradation and Recovery of Metal-Oxide-Semiconductor (MOS) Devices Stressed with Fowler-Nordheim (FN) Gate Current
- Direct Determination of Interface Trapped Charges
- Enhanced Degradation During Static Stressing of a Metal Oxide Semiconductor Field Effect Transistor Embedded in a Circuit
- Effects of Thermal Stability of Si_Ge_xC_y Layers on Properties of Their Contacts with Aluminum
- A New Two-Transistor MACRO Modeling of Source Side Injection (SSI) Flash Cell Considering Remote-Electrode Induced Barrier Lowering (RIBL)