GUPTA Ashawant | Microelectronics Laboratory, Santa Clara University
スポンサーリンク
概要
関連著者
-
YANG Cary
Microelectronics Laboratory, Santa Clara University
-
GUPTA Ashawant
Microelectronics Laboratory, Santa Clara University
-
Yu Paul
Department Of Electrical And Computer Engineering University Of California
-
Nishida Takashi
Central Research Laboratory Hitachi Ltd.
-
SUGIHARTO Dewi
Microelectronics Laboratory, Santa Clara University
-
MATSUZAKI Nozomu
Central Research Laboratory, Hitachi, Ltd.
-
MINAMI Masataka
Central Research Laboratory, Hitachi, Ltd.
-
YAMANAKA Toshiaki
Central Research Laboratory, Hitachi, Ltd.
-
NAGANO Takahiro
Central Research Laboratory, Hitachi, Ltd.
-
Gupta Ashawant
Microelectronics Laboratory Santa Clara University
-
MI Jian
Microelectronics Laboratory, Santa Clara University
-
ZHU Jintian
Department of Electrical and Computer Engineering, University of California
-
WARREN Patricia
Institute for Micro- and Optoelectronics, Department of Physics Swiss Federal Institute of Technolog
-
DUTOIT Michel
Institute for Micro- and Optoelectronics, Department of Physics Swiss Federal Institute of Technolog
-
Mi Jian
Microelectronics Laboratory Santa Clara University
-
Zhu Jintian
Department Of Electrical And Computer Engineering University Of California
-
Dutoit Michel
Institute For Micro- And Optoelectronics Department Of Physics Swiss Federal Institute Of Technology
-
Warren Patricia
Institute For Micro- And Optoelectronics Department Of Physics Swiss Federal Institute Of Technology
-
Yang Cary
Microelectronics Laboratory Santa Clara University
-
Yang Cary
Microelectronics Lab. Santa Clara University
著作論文
- Enhanced Degradation During Static Stressing of a Metal Oxide Semiconductor Field Effect Transistor Embedded in a Circuit
- Effects of Thermal Stability of Si_Ge_xC_y Layers on Properties of Their Contacts with Aluminum