MATSUZAKI Nozomu | Central Research Laboratory, Hitachi, Ltd.
スポンサーリンク
概要
関連著者
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MATSUZAKI Nozomu
Central Research Laboratory, Hitachi, Ltd.
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YANG Cary
Microelectronics Laboratory, Santa Clara University
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Nishida Takashi
Central Research Laboratory Hitachi Ltd.
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GUPTA Ashawant
Microelectronics Laboratory, Santa Clara University
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SUGIHARTO Dewi
Microelectronics Laboratory, Santa Clara University
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MINAMI Masataka
Central Research Laboratory, Hitachi, Ltd.
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YAMANAKA Toshiaki
Central Research Laboratory, Hitachi, Ltd.
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NAGANO Takahiro
Central Research Laboratory, Hitachi, Ltd.
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Matsuzaki Nozomu
Central Research Laboratory Hitachi Ltd.
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Kume Hitoshi
Central Research Laboratory
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Ishimaru Tetsuya
Central Research Laboratory Hitachi Ltd.
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HASHIMOTO Takashi
Renesas Technology Corp.
著作論文
- Enhanced Degradation During Static Stressing of a Metal Oxide Semiconductor Field Effect Transistor Embedded in a Circuit
- Nitride-based nonvolatile memory and role of SiON dielectric film for performance improvement