SEKO Akiyoshi | Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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概要
- Seko Akiyoshiの詳細を見る
- 同名の論文著者
- Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya Universityの論文著者
関連著者
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SEKO Akiyoshi
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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Watanabe Yukihiko
Toyota Central R&d Labs. Inc.
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Sakai Akira
Department Of Agricultural Chemistry The University Of Tokyo
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Kondo Hiroki
Deparment Of Physics Saga University
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Yasuda Y
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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SAKAI Akira
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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KONDO Hiroki
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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ZAIMA Shigeaki
Center for Cooperative Research in Advanced Science and Technology, Nagoya University
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近藤 博基
名古屋大学大学院工学研究科
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Sakai A
Division Of Electrical And Computer Engineering Yokohama National University
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Zaima Shigeaki
Center For Cooperative Research In Advanced Science & Technology Nagoya University
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Seko Akiyoshi
Graduate School Of Engineering Nagoya University
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酒井 彰
室蘭工大工
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Yasuda Yukio
Department Of Applied Physics Osaka City University
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WATANABE Yukihiko
Toyota Central R&D Labs., Inc.
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Zaima Shigeaki
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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Yasuda Yukio
Department Of Applied Physics Faculty Of Engineering Nagoya University
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酒井 明
京大工
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WATANABE Yukihiko
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University
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Sakashita Mitsuo
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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Sakai A
Department Of Crystalline Materials Science Graduate School Of Engineering Nagoya University
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OGAWA Masaki
Center for Cooperative Research in Advanced Science & Technology, Nagoya University
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Sago Toshifumi
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Zaima Shigeaki
Center for Cooperative Research in Advanced Science and Technology, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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YASUDA Yukio
Toyota Central R&D Labs., Inc
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Kondo H
Department Of Biochemical Engineering And Science Kyushu Institute Of Technology
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Zaima S
Nagoya Univ. Nagoya Jpn
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Yasuda Yukio
Toyota Central R&D Labs., Inc, Nagakute, Aichi 480-1192, Japan
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Yasuda Yukio
Research Institute of KUT, Kochi University of Technology, Tosayamada-cho, Kochi 782-8502, Japan
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Zaima Shigeaki
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Watanabe Yukihiko
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Watanabe Yukihiko
Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan
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Seko Akiyoshi
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
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Ogawa Masaki
Center for Cooperative Research in Advanced Science and Technology, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan
著作論文
- Behavior of Local Current Leakage in Stressed Gate SiO_2 Films Analyzed by Conductive Atomic Force Microscopy
- Detection and Characterization of Stress-Induced Defects in Gate SiO_2 Films by Conductive Atomic Force Microscopy
- Conductive Atomic Force Microscopy Analysis for Local Electrical Characteristics in Stressed SiO_2 Gate Films
- Microscopic Analysis of Stress-Induced Leakage Current in Stressed Gate SiO_2 Films Using Conductive Atomic Force Microscopy
- Detection and Characterization of Stress-Induced Defects in Gate SiO2 Films by Conductive Atomic Force Microscopy
- Characterization of Local Current Leakage in La2O3–Al2O3 Composite Films by Conductive Atomic Force Microscopy
- Microscopic Analysis of Stress-Induced Leakage Current in Stressed Gate SiO2 Films Using Conductive Atomic Force Microscopy
- Behavior of Local Current Leakage in Stressed Gate SiO2 Films Analyzed by Conductive Atomic Force Microscopy
- Analysis of Local Breakdown Process in Stressed Gate SiO2 Films by Conductive Atomic Force Microscopy
- Behavior of Local Charge-Trapping Sites in La2O3–Al2O3 Composite Films under Constant Voltage Stress