OKADA Masaya | Institute of Technology and Science, The University of Tokushima
スポンサーリンク
概要
関連著者
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Ohno Yasuo
Univ. Tokushima Tokushima‐shi Jpn
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AO Jin-Ping
Institute of Technology and Science, The University of Tokushima
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OKADA Masaya
Institute of Technology and Science, The University of Tokushima
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HU Cheng-Yu
Institute of Technology and Science, The University of Tokushima
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OHNO Yasuo
Institute of Technology and Science, The University of Tokushima
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Ao Jin‐ping
Univ. Tokushima Tokushima‐shi Jpn
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Okada Masaya
Univ. Tokushima Tokushima‐shi Jpn
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YAMAOKA Yuya
Institute of Technology and Science, The University of Tokushima
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Ao Jin-ping
Satellite Venture Business Laboratory The University Of Tokushima
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Ao J‐p
Univ. Tokushima Tokushima‐shi Jpn
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岡田 政也
徳島大学ソシオテクサイエンス研究部
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Okada Masaya
Institute Of Technology And Science The University Of Tokushima
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Hu Cheng‐yu
Univ. Tokushima Tokushima Jpn
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Ohno Yasuo
Institute Of Technology And Science The University Of Tokushima
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Hu Cheng-yu
Institute Of Technology And Science The University Of Tokushima
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Okada Masaya
Dept. of Electrical and Electronic Eng., The University of Tokushima, Tokushima 770-8506, Japan
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Yamaoka Yuya
Institute Of Technology And Science The University Of Tokushima
著作論文
- Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress
- A Study on Ohmic Contact to Dry-Etched p-GaN
- Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress