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Japan Society of Applied Physics | 論文
- Pitch-Independent Realization of 30-nm-Diameter InGaAs Nanowire Arrays by Two-Step Growth Method in Selective-Area Metalorganic Vapor-Phase Epitaxy
- Reduction in Interface Trap Density of Al₂O₃/SiGe Gate Stack by Electron Cyclotron Resonance Plasma Post-nitridation
- Conductance Spectroscopy Study on Interface Electronic States of HfO2/Si Structures: Comparison with Interface Dipole
- Photoassisted Scanning Tunneling Spectroscopy Study on the Local Spot Strucutres in Thin HfO2 Film on Si
- Highly (001)-Textured L1₀ FePt-SiO₂-C Films with Well-Isolated Small Grains Using TiON Intermediate Layer
- Simple Method for Crystallizing Ceramic Thin Films Using Platinum Bottom Electrodes as Resistive Heating Elements
- Power-Law Stress and Creep Relaxations of Single Cells Measured by Colloidal Probe Atomic Force Microscopy
- Five-Octave-Spanning Supercontinuum Generation in Fluoride Glass
- Avalanche-Type High Sensitive Image Pickup Tube Using an a-Se Photoconductive Target
- Laser-Induced Wrinkling in Chalcogenide Glass Films on Viscous Layers
- Structural Properties of m-Plane InAIN Films Grown on ZnO Substrates with Room-Temperature GaN Buffer Layers
- High-Temperature Regeneration of Perpendicular Exchange Bias in a Pt/Co/Pt/α-Cr₂O₃/Pt Thin Film System
- Scanning Tunneling Microscopy and Spectroscopy Study of LiBr/Si(001) Heterostructure
- Stoner-Wohlfarth Like Magnetization Switching in Very Small Co/Pt Nanodots under the Assistance of Radio Frequency Magnetic Field
- Effects of Si Doping on Phase Transition of Ge2Sb2Te5 Films by in situ Resistance Measurements
- Synthesis and Characterization of Y2O3:Eu Phosphor Derived by Solution-Combustion Method
- Direct Growth of $m$-plane GaN with Epitaxial Lateral Overgrowth from $c$-plane Sidewall of $a$-plane Sapphire
- Layer-by-Layer Growth of InAlN Films on ZnO($000\bar{1}$) Substrates at Room Temperature
- Room-Temperature Epitaxial Growth of GaN on Atomically Flat MgAl2O4 Substrates by Pulsed-Laser Deposition
- Very High-Density Ferroelectric Digital Data Storage Using Tracking and Error Correction Technique