Issues and Reliability of High-Density FeRAMs
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-04-30
著者
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Lee S
Feram Team Memory R&d Division Hynix Semiconductor Incorporated
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Lee Seaung-suk
New Device Team Memory R&d Division Hynix Semiconductor Inc.
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Kang Hee-bok
New Device Team R&d Division Hynix Semiconductor Inc.
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Park Young
Feram Team Memory R&d Division Hynix Semiconductor Incorporated
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Park Young-jin
New Device Team Memory R&d Division Hynix Semiconductor Inc.
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Noh K
Hynix Semiconductor Incorporated Kyoungki‐do Kor
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LEE Seok
New Device Team, Memory R&D Division, Hynix Semiconductor Inc.
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NOH Keum-Hwan
New Device Team, R&D Division, Hynix Semiconductor Inc.
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TANG Beelyong
Department of Materials Science & Engineering, Kumoh National Institute of Technology
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