LEE Seok | New Device Team, Memory R&D Division, Hynix Semiconductor Inc.

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概要

• 同名の論文著者
• New Device Team, Memory R&D Division, Hynix Semiconductor Inc.の論文著者

関連著者

• Lee Seaung-suk

  New Device Team Memory R&d Division Hynix Semiconductor Inc.

• Park Young-jin

  New Device Team Memory R&d Division Hynix Semiconductor Inc.

• Noh K

  Hynix Semiconductor Incorporated Kyoungki‐do Kor

• LEE Seok

  New Device Team, Memory R&D Division, Hynix Semiconductor Inc.

• Lee S

  Feram Team Memory R&d Division Hynix Semiconductor Incorporated

• Kang Hee-bok

  New Device Team R&d Division Hynix Semiconductor Inc.

• Park Young

  Feram Team Memory R&d Division Hynix Semiconductor Incorporated

• Kang Y

  Hynix Semiconductor Incorporated Kyoungki‐do Kor

• NOH Keum

  New Device Team, Memory R&D Division, Hynix Semiconductor Inc.

• KANG Young

  New Device Team, Memory R&D Division, Hynix Semiconductor Inc.

• YANG Beelyong

  New Device Team, Memory R&D Division, Hynix Semiconductor Inc.

• NOH Keum-Hwan

  New Device Team, R&D Division, Hynix Semiconductor Inc.

• TANG Beelyong

  Department of Materials Science & Engineering, Kumoh National Institute of Technology

• Yang Beelyong

  New Device Team Memory R&d Division Hynix Semiconductor Inc.

• Kang Young

  New Device Team Memory R&d Division Hynix Semiconductor Inc.

• Lee Seok

  New Device Team Memory R&d Division Hynix Semiconductor Inc.

• Noh Keum

  New Device Team, Memory R&D Division, Hynix Semiconductor Inc., San 136-1 Ami-ri Bubal-eub Ichon-si, Kyoungki-do 467-701, Korea

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著作論文

• Imprint Characteristics of Ferroelectric Thin Films at Elevated Storage and Operation Temperatures
• Issues and Reliability of High-Density FeRAMs

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