Kang Young | New Device Team Memory R&d Division Hynix Semiconductor Inc.
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概要
関連著者
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Lee Seaung-suk
New Device Team Memory R&d Division Hynix Semiconductor Inc.
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Park Young-jin
New Device Team Memory R&d Division Hynix Semiconductor Inc.
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Yang Beelyong
New Device Team Memory R&d Division Hynix Semiconductor Inc.
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Kang Young
New Device Team Memory R&d Division Hynix Semiconductor Inc.
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Lee Seok
New Device Team Memory R&d Division Hynix Semiconductor Inc.
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Noh Keum
New Device Team, Memory R&D Division, Hynix Semiconductor Inc., San 136-1 Ami-ri Bubal-eub Ichon-si, Kyoungki-do 467-701, Korea
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Kang Y
Hynix Semiconductor Incorporated Kyoungki‐do Kor
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Noh K
Hynix Semiconductor Incorporated Kyoungki‐do Kor
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NOH Keum
New Device Team, Memory R&D Division, Hynix Semiconductor Inc.
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KANG Young
New Device Team, Memory R&D Division, Hynix Semiconductor Inc.
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YANG Beelyong
New Device Team, Memory R&D Division, Hynix Semiconductor Inc.
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LEE Seok
New Device Team, Memory R&D Division, Hynix Semiconductor Inc.
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Lee Seaung-Suk
New Device Team, Memory R&D Division, Hynix Semiconductor Inc., San 136-1 Ami-ri Bubal-eub Ichon-si, Kyoungki-do 467-701, Korea
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Park Young-Jin
New Device Team, Memory R&D Division, Hynix Semiconductor Inc., San 136-1 Ami-ri Bubal-eub Ichon-si, Kyoungki-do 467-701, Korea
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Lee Seok
New Device Team, Memory R&D Division, Hynix Semiconductor Inc., San 136-1 Ami-ri Bubal-eub Ichon-si, Kyoungki-do 467-701, Korea
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Kang Young
New Device Team, Memory R&D Division, Hynix Semiconductor Inc., San 136-1 Ami-ri Bubal-eub Ichon-si, Kyoungki-do 467-701, Korea
著作論文
- Imprint Characteristics of Ferroelectric Thin Films at Elevated Storage and Operation Temperatures
- Imprint Characteristics of Ferroelectric Thin Films at Elevated Storage and Operation Temperatures