Silicon Integrated Waveguide Modulator Based on a Three-Terminal Device Structure
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概要
- 論文の詳細を見る
We report a comprehensive study on the silicon optical waveguide modulators fabricated with and without the isolation trenches based on a modified structure of junction field-effect transistor (JFET). The particular emphases are dedicated to elucidating the influences of various device dimensions on their corresponding modulation efficiencies and frequency responses. Specifically, the enhancement in the modulation depth of the devices was clearly observed as their rib waveguide widths or modulation lengths became respectively wider or longer. In fact, a nearly 100% modulation index could be achieved with a bias voltage as low as 4 V. Furthermore, the modulation efficiency of the devices was evidently improved with a substantial degree by adopting a three-terminal JFET structure for signal modulation; the lowest rise and fall times obtained were 250 and 400 μs, respectively. Finally, adding trenches to each side of the rib seemed to impede the carriers flow, thereby slowing down the carrier injection or accumulation speed during the actual device operation.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2009-04-25
著者
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Chuang Ricky
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Liao Zhen-liang
Institute Of Microelectronics Department Of Electrical Engineering And Advanced Optoelectronic Techn
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Hsu Mao-teng
Institute Of Microelectronics Department Of Electrical Engineering And Advanced Optoelectronic Techn
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Cheng Chih-chieh
Institute Of Microelectronics Department Of Electrical Engineering And Advanced Optoelectronic Techn
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Liao Zhen-Liang
Institute of Microelectronics, Department of Electrical Engineering, Advanced Optoelectronic Technology Center (AOTC), and Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Hsu Mao-Teng
Institute of Microelectronics, Department of Electrical Engineering, Advanced Optoelectronic Technology Center (AOTC), and Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Chuang Ricky
Institute of Microelectronics, Department of Electrical Engineering, Advanced Optoelectronic Technology Center (AOTC), and Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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Cheng Chih-Chieh
Institute of Microelectronics, Department of Electrical Engineering, Advanced Optoelectronic Technology Center (AOTC), and Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 70101, Taiwan, R.O.C.
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