High-Power 200 mW 660 nm AlGaInP Laser Diodes with Low Operating Current
スポンサーリンク
概要
- 論文の詳細を見る
We have newly introduced a two-step-growth structure and a ridge stripe with steep sidewalls formed with a dry-etching process in the fabrication of a buried ridge stripe structure of a high-power 660 nm laser diode instead of a conventional three-step-growth structure and a ridge stripe with gentle sidewalls formed with a conventional wet-etching process in order to reduce the operating current. We have found that the two-step-growth structure provides better heat dissipation and the dry-etched ridge stripe structure offers higher characteristic temperature. The operating current under pulsed 200 mW at 70°C of the fabricated laser diode is 270 mA. This is the lowest value ever reported so far, to our knowledge. These laser diodes exhibit a kink level and a maximum light output power of 220 mW and higher than 300 mW, respectively. These laser diodes have also operated stably for 1500 h at 70°C with a light output power of 200 mW under the pulsed condition.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-04-15
著者
-
Hiroyama Ryoji
Materials & Devices Development Center Bu Sanyo Electric Co. Ltd.
-
Inoue Daijiro
Materials & Devices Development Center Bu Sanyo Electric Co. Ltd.
-
Shono Masayuki
Materials & Devices Development Center BU, SANYO Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
-
Kameyama Shingo
Materials & Devices Development Center BU, SANYO Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
-
Tajiri Atsushi
Materials & Devices Development Center BU, SANYO Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
-
Sawada Minoru
LED Business Unit, Tottori Sanyo Electric Co., Ltd., 5-318 Tachikawa, Tottori 680-8634, Japan
-
Ibaraki Akira
Materials & Devices Development Center BU, SANYO Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
-
Inoue Daijiro
Materials & Devices Development Center BU, SANYO Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
-
Hiroyama Ryoji
Materials & Devices Development Center BU, SANYO Electric Co., Ltd., 1-18-13 Hashiridani, Hirakata, Osaka 573-8534, Japan
関連論文
- Quantification of Electrical Deactivation by Triply Negative Charged Ga Vacancies in Highly Doped Thin GaAs Layers
- Excellent Thermally-Stable Epitaxial Channel for Implanted Planar-Type Hetero-Junction Field-Effect Transistors
- Relationship between Low-Noise Performance and Electron Confinement in the Channel of Two-Mode Channel Field-Effect Transistors in a Low-Drain-Current Condition
- New Plamar Two-Mode Channel Field-Effect Transistor Suitable for L-Band Microwave Monolithic Integrated Circuits with RF Transmission and Reception Blocks Operating at V_≤2 V
- A Superlow-Noise AlGaAs/InGaAs/GaAs Doped Channel Heterojunction Field-Effect Transistor (DC-HFET) with 0.15-μm Gate Length
- A New High Electron Mobility Transistor (HEMT) Structure with a Narrow Quantum Well Formed by Inserting a Few Monolayers in the Channel
- Operation at 700℃ of 6H-SiC UV Sensor Fabricated Using N^+ Implantation
- Reduction in Operating Current of High-Power 660nm Laser Diodes Using a Transparent AlGaAs Cap Layer
- Reduction in Operating Current of High-Power 660-nm Laser Diodes Using a Transparent AlGaAs Cap Layer
- Quantification of Electrical Deactivation by Triply Negative Charged Ga Vacancies in Highly Doped Thin GaAs Layers
- High-Power 660-nm-Band AlGaInP Laser Diodes with a Small Aspect Ratio for Beam Divergence
- High-Power 200 mW 660 nm AlGaInP Laser Diodes with Low Operating Current