Localized Degradation of an MgO Layer in an Over-Frequency Accelerated Discharge of a Plasma Display Panel
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概要
- 論文の詳細を見る
The experimental and numerical studies of the degradation process of an MgO layer were performed in order to obtain a fundamental guideline for the lifetime evaluation of a plasma display panel (PDP). From the experimental results of an over-frequency accelerated discharge test and surface analyses of the MgO layer, it was found that the degradation process was divided into the sputter-erosion by the bombarding ions and the deposited impurities progressed on the MgO surface during the accelerated discharge. The numerical analysis of the plasma behavior and structure during PDP discharge was performed to explain these experimental results. The localized degradation of the MgO surface was due to the unevenness of the ion bombardment, which was further expedited by the wall charge behavior. The combination of these factors was found to explain the localized degradation process in the MgO layer during the accelerated PDP discharge.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-02-15
著者
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Kim Young-kee
Department Of Agricultural Chemistry Chungbuk National University
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Shon Chae-hwa
Applied Electrophysics Group Korea Electrotechnology Research Institute (keri)
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Wada Masayuki
Department Of Electrical And Electronic Engineering University Of Miyazaki
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Park Chung-hoo
Department Of Electrical Engineering Pusan National University
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Sung Youl-moon
Department Of Electrical And Electronic Engineering Miyazaki University
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Honda Chikahisa
Department Of Electrical And Electronic Engineering University Of Miyazaki
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Otsubo Masahisa
Department Of Electrical And Electronic Engineering Faculty Of Engineering University Of Miyazaki
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Wada Masayuki
Department of Electrical and Electronic Engineering, University of Miyazaki, 1-1 Gakuenkibanadai Nishi, Miyazaki 889-2192, Japan
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Kim Young-Kee
Department of Electrical Engineering, Pusan National University, 30 Jangjeon-dong, Geumjeong-gu, Pusan 609-735, Korea
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Shon Chae-Hwa
Applied Electrophysics Group, Korea Electrotechnology Research Institute (KERI), 28-1, Seongju-dong, Changwon 641-120, Korea
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Otsubo Masahisa
Department of Electrical and Electronic Engineering, University of Miyazaki, 1-1 Gakuenkibanadai Nishi, Miyazaki 889-2192, Japan
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Park Chung-Hoo
Department of Electrical Engineering, Pusan National University, 30 Jangjeon-dong, Geumjeong-gu, Pusan 609-735, Korea
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Sung Youl-Moon
Department of Electrical and Electronic Engineering, University of Miyazaki, 1-1 Gakuenkibanadai Nishi, Miyazaki 889-2192, Japan
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Honda Chikahisa
Department of Electrical and Electronic Engineering, University of Miyazaki, 1-1 Gakuenkibanadai Nishi, Miyazaki 889-2192, Japan
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