Oxygen and Sulfur Adsorption Effects on Electronic States of GaAs(100) Surfaces Studied with Discrete Variational $X\alpha$ Method
スポンサーリンク
概要
- 論文の詳細を見る
The electronic states of Ga-terminated and As-terminated GaAs(100)-($1\times 1$) surfaces and those surfaces with adsorbed O and S are studied by molecular orbital calculation using small cluster models and the discrete variational $X{\alpha}$ method. Without adsorption of any foreign atoms, the Ga-terminated surface has 4p-related surface states in the middle of the forbidden band. While, the As-terminated surface has 4p-related surface states in the lower half of the forbidden band. The adsorption sites of chalcogen atoms on Ga- and As-terminated surfaces are determined ab initio by using density functional theory (Gaussian 98). With adsorbed chalcogen atoms, the density of the surface states in the forbidden band of the surface Ga layer markedly decreases, and that of the surface As layer increases. The adsorbates have states in the lower half of the band gap (Ga-terminated surface) or in the valence band (As-terminated surface). The results suggest that a chalcogen adsorbed Ga-terminated and bare As-terminated surface have low surface densities in the upper half of the band gap.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-12-15
著者
-
Inokuma Takao
Graduate School Of Natural Science And Technology Kanazawa University
-
Kasai Yuhki
Research And Development Center Electronic And Plastic Materials Company Matsushita Electric Works L
-
Yamamura Youichi
Graduate School Of Natural Science And Technology Kanazawa University
-
Miyamura Satoshi
Graduate School Of Natural Science And Technology Kanazawa University
-
Takamiya Saburo
Graduate School Of Natural Science And Technology Division Of Electrical Engineering And Computer Sc
-
Iiyama Koichi
Graduate School Of Natural Science And Technology Division Of Electrical Engineering And Computer Sc
-
Iiyama Koichi
Graduate School of Natural Science and Technology, Kanazawa University, 2-40-20 Kodatsuno, Kanazawa, Ishikawa 920-8667, Japan
-
Takamiya Saburo
Graduate School of Natural Science and Technology, Kanazawa University, 2-40-20 Kodatsuno, Kanazawa, Ishikawa 920-8667, Japan
-
Kasai Yuhki
Research and Development Center, Electronic and Plastic Materials Company, Matsushita Electric Works, Ltd., 1084 Kadoma, Osaka 571-8686, Japan
-
Miyamura Satoshi
Graduate School of Natural Science and Technology, Kanazawa University, 2-40-20 Kodatsuno, Kanazawa, Ishikawa 920-8667, Japan
-
Yamamura Youichi
Graduate School of Natural Science and Technology, Kanazawa University, 2-40-20 Kodatsuno, Kanazawa, Ishikawa 920-8667, Japan
関連論文
- Mechanical Stress Caused by Adsorption of O or N on Ga-terminated (100) GaAs Surface and InAl-terminated (100) InAlAs Surface : Degradation of Insulator/Semiconductor Interface
- Studies of Effects of Adsorption of Silicon or Germanium on the Electronic States of (100) GaAs Surfaces
- Oxygen and Sulfur Adsorption Effects on Electronic States of GaAs(100) Surfaces Studied with Discrete Variational Xα Method
- Structural and Electrical Characterization of Oxidated, Nitridated and Oxi-nitridated (100) GaAs Surfaces
- Oxidation of InAlAs and Its Application to Gate Insulator of InAlAs/InGaAs Metal Oxide Semiconductor High Electron Mobility Transistor
- Equivalent Circuit Model of InAlAs/InGaAs/InP Heterostructure Metal-Semiconductor-Metal Photodetectors(Lasers, Quantum Electronics)
- Application of Brightness of Scanning Electron Microscope Images to Measuring Thickness of Nanometer-Thin SiO_2 Layers on Si Substrates : Semiconductors
- I-V Characteristics of Schottky/Metal-Insulator-Semiconductor Diodes with Tunnel Thin Barriers
- Annealing Effects on Cathodoluminescence Properties of SiOx Films Deposited by Radio Frequency Sputtering
- Experimental Study of Lasing Characteristics of Brillouin/Erbium Optical Fiber Laser(Optoelectronics)
- Formation of Step-Free Surfaces on Diamond (111) Mesas by Homoepitaxial Lateral Growth
- GaAs Metal Insulator Semiconductor Field Effect Transistor with Oxi-Nitrided Gate Film Formed by New Process Utilizing Al Layer as Resist Film for Selective Etching, Oxi-Nitridation and Lift-Off
- Effect of Oxidation using Ultraviolet Light and Ozone and Subsequent Nitridation using Electron Cyclotron Resonance Plasma on Gate Portion of GaAs Field-Effect Transistors
- Structural and Electrical Characterization of Oxidated, Nitridated and Oxi-nitridated (100) GaAs Surfaces
- Studies of Effects of Adsorption of Silicon or Germanium on the Electronic States of (100) GaAs Surfaces
- Oxygen and Sulfur Adsorption Effects on Electronic States of GaAs(100) Surfaces Studied with Discrete Variational $X\alpha$ Method
- Mechanical Stress Caused by Adsorption of O or N on Ga-terminated (100) GaAs Surface and InAl-terminated (100) InAlAs Surface: Degradation of Insulator/Semiconductor Interface
- Formation of Graphene-on-Diamond Structure by Graphitization of Atomically Flat Diamond (111) Surface
- Formation of Graphene-on-Diamond Structure by Graphitization of Atomically Flat Diamond (111) Surface (SELECTED TOPICS IN APPLIED PHYSICS : Nano Electronics and Devices : Characterization and Control of Nano Surfaces and Interfaces)