Suppression of the Josephson Current in Normal-Distribution-Shaped Tunnel Junctions
スポンサーリンク
概要
- 論文の詳細を見る
The magnetic field dependence of the Josephson current of a Josephson tunnel junction whose shape was a normal distribution is analyzed for superconducting tunnel junction (STJ) photon detector applications. It was found that the Josephson current of a normal distribution junction is very sensitive to the external magnetic field and follows a function of $\exp (-B^2)$, while a conventional rectangular STJ exhibits the well-known Fraunhofer pattern of $\sin x/x$. Numerical calculations show that the Josephson current of the normal distribution junction can be suppressed by an external magnetic field that is one tenth of that needed for conventional rectangular junctions. Calculations of a normal distribution junction approximated with a 1 $\mu$m mesh also show that the Josephson current is sufficiently suppressed by a small magnetic field. The effect of the misalignment of the angle between the junction and the magnetic field was evaluated. It was found that for a normal-distribution-shaped junction, misalignment of the magnetic field is allowed within ${\pm} 5^{\circ}$, suppressing the Josephson effect by two orders of magnitude more than that of a rectangular junction.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2000-10-15
著者
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Myoren Hiroaki
Department Of Electrical And Electronic Systems Faculty Of Engineering Saitama University
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Takada Susumu
Department Of Chemistry Faculty Of Science Shizuoka University
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Iizuka Takeshi
Department Of Chemistry Faculty Of Education Gunma University
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Kikuchi Katsuya
Department of Electrical and Electronic Systems, Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Urawa, Saitama 338-8570, Japan
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Takada Susumu
Department of Electrical and Electronic Systems, Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Urawa, Saitama 338-8570, Japan
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Iizuka Takeshi
Department of Electrical and Electronic Systems, Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Urawa, Saitama 338-8570, Japan
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Myoren Hiroaki
Department of Electrical and Electronic Systems, Faculty of Engineering, Saitama University, 255 Shimo-Okubo, Urawa, Saitama 338-8570, Japan
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Kikuchi Katsuya
Department of Electrical and Electronic Systems, Faculty of Engineering, Saitama University
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