Universal test sets for reversible circuits (コンカレント工学)

概要

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A set of test vectors is complete for a reversible circuit if it covers all stuck-at faults on the wires of the circuit. It has been known that any reversible circuit has a surprisingly small complete test set, while it is NP-hard to generate a minimum complete test set for a reversible circuit. A test set is universal for a family of reversible circuits if it is complete for any circuit in the family. We show minimum universal test sets for some families of CNOT circuits.
社団法人電子情報通信学会の論文
2009-11-19

著者

TAYU Satoshi
Department of Communication and Integrated Systems, Tokyo Institute of Technology
UENO Shuichi
Department of Communication and Integrated Systems, Tokyo Institute of Technology
Ueno Shuichi
Dept. Of Communications And Integrated Systems Tokyo Institute Of Technology
Ueno Shuichi
東工大
Tayu Satoshi
Dept. Of Communications And Integrated Systems Tokyo Institute Of Technology
FUKUYAMA Shota
Department of Communications and Integrated Systems Tokyo Institute of Technology
Ueno Shuichi
Department Of Communication And Integrated Systems Tokyo Institute Of Technology
Tayu Satoshi
Department Of Communication And Integrated Systems Tokyo Institute Of Technology
Ueno Shuichi
Department Of Biological Science Faculty Of Science Yamaguchi University

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Universal test sets for reversible circuits (コンカレント工学)

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