On Two Problems of Nano-PLA Design
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概要
- 論文の詳細を見る
The logic mapping problem and the problem of finding a largest sub-crossbar with no defects in a nano-crossbar with nonprogrammable-crosspoint defects and disconnected-wire defects are known to be NP-hard. This paper shows that for nano-crossbars with only disconnected-wire defects, the former remains NP-hard, while the latter can be solved in polynomial time.
著者
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Shrestha Anish
Department Of Communications And Integrated Systems Tokyo Institute Of Technology
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TAKAOKA Asahi
Department of Communication and Integrated Systems, Tokyo Institute of Technology
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TAYU Satoshi
Department of Communication and Integrated Systems, Tokyo Institute of Technology
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UENO Shuichi
Department of Communication and Integrated Systems, Tokyo Institute of Technology
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