A-1-7 Universal Test Sets for Reversible Circuits
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概要
- 論文の詳細を見る
- 社団法人電子情報通信学会の論文
- 2009-09-01
著者
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Ueno Shuichi
Dept. Of Communications And Integrated Systems Tokyo Institute Of Technology
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Tayu Satoshi
Dept. Communications And Integrated Systems Tokyo Inst. Tech
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Tayu Satoshi
Dept. Of Communications & Integrated Syst. Tokyo Inst. Of Tech.
-
Ueno Shuichi
Dept. Of Communications & Integrated Syst. Tokyo Inst. Of Tech.
-
Ueno Shuichi
Dept. Communications and Integrated Systems, Tokyo Inst. Tech
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