A-1-32 A Note on Fault Testing for Reversible Circuits

概要

論文の詳細を見る
社団法人電子情報通信学会の論文
2010-03-02

著者

Ueno Shuichi
Department Of Communication And Integrated Systems Tokyo Institute Of Technology
Tayu Satoshi
Department Of Communication And Integrated Systems Tokyo Institute Of Technology
Ueno Shuichi
Department Of Biological Science Faculty Of Science Yamaguchi University

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A-1-32 A Note on Fault Testing for Reversible Circuits

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