1009 マイクロX線による鉛フリーはんだのウィスカ発生に係わる内部応力の評価とその防止法に関する研究(関東支部茨城講演会)

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The whisker (mustached crystal) generate on lead-free plating. And this causes an accident which electric short -circuit happen in printing circuit board or a terminal. What is more, the whisker itself is very fine and could not be checked with naked eye, but failure of apparatus is suddenly caused. It is important for the reliability and life of an electronic device. However the mechanism of whisker growth is still indefinite. There are various argument about preventing whisker generation, but no theory is consistently approved. In such situation, factor contributing to generating mechanism of whisker is studied in this research. Especially, inside plating to internal stress and influence internal stress abandon re-fusion processing quantitative evaluation in this research. The result is shown in the following.
社団法人日本機械学会の論文
2005-09-08

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