Structural Study of an Amorphous Bi-Fe-Ca-O Thin Film by the Anomalous X-ray Scattering
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概要
- 論文の詳細を見る
The structure of the amorphous Bi-Fe-Ca-O film with 0.3 m thick grown on the Si single crystal was studied by the anomalous x-ray scattering (AXS) method. This relatively new method using the anomalous dispersion effect of a specific constituent element in a film reduces the difficulty in the subtraction process of a substrate intensity for estimating the net intensity of a thin film, which becomes a main cause of errors of the resultant data in the conventional method. The environmental radial distribution functions around Bi and Fe in the amorphous Bi-Fe-Ca-O film were determined, from which the structural features were obtained.
- 東北大学の論文
- 1989-03-20
著者
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Matsubara E.
Research Institute of Mineral Dressing and Metallurgy (SENKEN)
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Waseda Y.
Research Institute of Mineral Dressing and Metallurgy (SENKEN)
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Masumoto T.
Institute For Materials Research
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Mitera M.
Institute for Materials Research
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Mitera M.
Institute For Materials Research:(present Address)laboratory Of Amorphous Magnetic Devices
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