In-House Facility for Characterizing Surface Structure of Materials by the Grazing Incidence X-ray Scattering (GIXS) Method
スポンサーリンク
概要
- 論文の詳細を見る
Grazing incidence x-ray scattering (GIXS) facility has been built. The system consists of a 18kW x-ray generator, a double crystal monochromator, crossed double-axis diffractometer, counting electronics and personal computer. Taking account of a couple of examples of the grazing incidence x-ray scattering (GIXS) with the synchrotron radiation, future applications of this new surface structural system are discussed.
- 東北大学の論文
- 1990-03-23
著者
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Matsubara E.
Research Institute of Mineral Dressing and Metallurgy (SENKEN)
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Waseda Y.
Research Institute of Mineral Dressing and Metallurgy (SENKEN)
関連論文
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- Structural Study of Binary Phosphate Glasses by X-ray and Neutron Diffraction
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- Anomalous X-ray Scattering Facility for Structural Characterization of Materials using Synchrotron Radiation
- In-House Facility for Characterizing Surface Structure of Materials by the Grazing Incidence X-ray Scattering (GIXS) Method
- Structure of Liquid Antimony by Neutron Diffraction
- IN-HOUSE FACILITY OF ANOMALOUS X-RAY SCATTERING FOR STRUCTURAL CHARACTERIZATION OF DISORDERED MATERIALS