LSI Board Fault Diagnosis using Adaptive Image Restoration to the Thermography

概要

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At present, VLSI chips have increased their number of input/output pins, therefore standard methods offault diagnosis, which uses limited input/output .pins, has become difficult. This research establishes a new concept diagnosis method which does not use input/output pins but apply the restoration thermography. This paper-comparesthree methods (Standard method, Histogram method and This method), after this, we confirmed that this method is superior to the other two methods. Consequently, this system has verified the possibility of fault 1C diagnosis bythermography restoration using the neural network whichwas constructed by the little learning data (134). Using this,method, a 96.43% fault diagnosis rate was obtained. As forthis reason, this paper' s neural network which inputs the difference image using learning data of 1C coordinate (1Cposition) with gradation value (1C heat generationtemperature) satisfactorily performed the for fault 1Cimage restoration. Moreover, by adding the addition emphasis process, the fault diagnosis rate progressed 1.72% more than the non-addition method.
小山工業高等専門学校の論文
2004-03-05