Scanning Nonlinear Dielectric Microscope Using a Lumped Constant Resonator Probe and Its Application to Investigation of Ferroelectric Polarization Distributions
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概要
- 論文の詳細を見る
A new probe using a lumped constant resonator for the scanning nonlinear dielectric microscope has been developed. This probe has sufficient resolution to observe the area distribution of ferroelectric polarization. Using this probe, the distributions of the domains in the thin film of a copolymer of vinylidene fluoride and trifluoroethylene and in a lithium niobate substrate with a titanium-diffused inversion layer are observed.
- 社団法人応用物理学会の論文
- 1997-05-30
著者
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Cho Yasuo
Department Of Electrical And Electronic Engineering Faculty Of Engineering Yamaguchi University
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Nakamura Kiyoshi
Department Of Electircal Communications Faculty Of Engineering Tohoku University
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Nakamura Kiyoshi
Department Of Electrical Communication Faculty Of Engineering Tohoku University
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ATSUMI Shigeyuki
Department of Electrical and Electronics Engineering, Faculty of Engineering, Yamaguchi University
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Atsumi Shigeyuki
Department Of Electrical And Electronics Engineering Faculty Of Engineering Yamaguchi University
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Nakamura Kiyoshi
Department Of Chemistry Faculty Of Science Shinshu University
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NAKAMURA Kiyoshi
Department of Biology, Faculty of Science, Okayama University
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