Ultra-High Vacuum Optical Second Harmonic Microscope
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概要
- 論文の詳細を見る
We have developed an optical second harmonic(SH)microscope for surface analysis in ultra-high vacuum. We have combined a commercial long-distance microscope, intensified charge coupled device(CCD)camera, optical filters, a cavity dumped mode-locked Nd^<3+> : YAG laser, and an ultra-high vacuum chamber for constructing the SH microscope. The spatial resolution of the SH microscope is estimated to be around 6μm. We have observed a nonuniform density distribution of CO adsorption on a Pt(110)surface.
- 社団法人応用物理学会の論文
- 2000-03-15
著者
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Ushioda Sukekatsu
School Of Materials Science Japan Advanced Institute Of Science And Technology
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Kurita Susumu
Laboratory Of Applied Physics Faculty Of Engineering Yokohama National University
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Mizutani Goro
School Of Materials Science Jaist
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Sano Haruyuki
School Of Materials Science Japan Advanced Institute Of Science And Technology
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Sonoda Y
School Of Materials Science Japan Advanced Institute Of Science And Technology
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SONODA Yasuyuki
School of Materials Science, Japan Advanced Institute of Science and Technology
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SEKIYA Takao
Laboratory of Applied Physics, Faculty of Engineering Yokohama National University
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Sekiya Takao
Laboratory Of Applied Physics Faculty Of Engineering Yokohama National University
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