Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope
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概要
- 論文の詳細を見る
- 2004-04-01
著者
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USHIODA Sukekatsu
RIKEN Photodynamics Research Center
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Ushioda Sukekatsu
Riken Photodynamics Research Center:japan Advanced Institute Of Science And Technology
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Ushioda Sukekatsu
School Of Materials Science Japan Advanced Institute Of Science And Technology
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Ushioda Sukekatsu
Research Institute Of Electrical Communication Tohoku University:riken Photodynamics Research Center
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Ushioda Sukekatsu
Research Institute Of Electrical Communication Tohoku University
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Ushioda Sukekatsu
Research Institute Of Electrical Communication Tohoku University And Crest-japan Science And Technol
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TSURUOKA Tohru
Research Institute of Electrical Communication, Tohoku University
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Tsuruoka Tohru
Research Institute Of Electrical Communication Tohoku University
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- Electron Energy Loss Spectra Showing the Effects of Surface Roughness and Electromagnetic Retardation : Theory and Experiment
- Comparison of Light-Emission Efficiencies from Si-Metal-Oxide-Semiconductor Junctions and from Si in Scanning Tunneling Microscopy
- Theory of Visible Light Emission from Scanning Tunneling Microscope
- Optical Observation of Single-Electron Charging Effect at Room Temperature
- Second Harmonic Generation from Si1-xGex Epitaxial Films with a Vicinal Face: Film Thickness Dependence
- Ultra-High Vacuum Optical Second Harmonic Microscope
- High Resolution Time-of-Flight Electron Spectrometer
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- Geometric Effect in Magnetization Reversal Studied by Spin-Polarized Secondary Electron Microscopy
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