Morphology Control of Cu Clusters Formed on H-Si (111) Surface in Solution by Si Potential
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1998-11-01
著者
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Ohdomari Iwao
Kagami Memorial Laboratory For Material Science And Technology Waseda University
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HARA Ken-ichi
School of Science and Engineering, Waseda University
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Hara Ken-ichi
School Of Science And Engineering Waseda University
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Ohdomari lwao
Kagami Memorial Laboratory for Material Science and Technology, Waseda University
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- Single-Event Upset Test of Static Random Access Memory Using Single-Ion Microprobe
- Site Dependence of Soft Errors Induced by Single-Ion Hitting in 64 kbit Static Random Access Memory (SRAM)
- Morphology Control of Cu Clusters Formed on H-Si (111) Surface in Solution by Si Potential
- Novel Process for High-Density Buried Nanopyramid Array Fabrication by Means of Dopant Ion Implantation and Wet Etching