Measurement of Temperature Behavior of Azimuthal Anchoring Energy at Liquid Crystal/SiO Interface Using New Method
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概要
- 論文の詳細を見る
By using a new method, we have measured the temperature dependence of the azimuthal anchoring energy at the interface between the nematic liquid crystal of phenyl-cyanobiphenyl (5CB) and 60° obliquely evaporated SiO film. A detailed comparison of our data with that of Faetti is carried out, and a good agreement between these two sets of data is obtained. This result indicates that the new method is very useful to evaluate the azimuthal anchoring energy at a liquid crystal/solid substrate interface.
- 社団法人応用物理学会の論文
- 1995-04-15
著者
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Kobayashi Sota
Silicon Systems Research Laboratories Nec Corporation
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IIMURA Yasufumi
The Institute of Physical and Chemical Research
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Iimura Y
Tokyo Univ. Agriculture And Technol. Tokyo Jpn
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Iimura Yasufumi
Division Of Electronic And Information Engineering Graduate School Of Technology Tokyo University Of
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Iimura Yasufumi
Faculty Of Technology Tokyo University Of Agriculture And Technology
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Kobayashi S
Science University Of Tokyo In Yamaguchi
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Kobayashi S
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology(aist)
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Imura Y
Japan Quality Assurance Organization Shizuoka Jpn
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Kobayashi Shunsuke
Science University Of Tokyo
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Kobayashi Shunsuke
Photonics Research Institute National Institute Of Advanced Industrial Science And Technology(aist)
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KOBAYASHI Shunsuke
Faculty of Technology, Tokyo University of Agriculture and Technology
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Kobayashi Shunsuke
Liquid Crystal Institute Science University Of Tokyo In Yamaguchi
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Kobayashi Norihiko
Faculty of Technology, Tokyo University of Agriculture and Technology
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Kobayashi Shunsuke
Faculty Of Technology Tokyo University Of Agriculture And Technology
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