Influence of Buffer Layers on Microstructural and Ferroelectric Characteristics of Sol-Gel Derived PbZr_xTi<1-x>O_3 Thin Films (<Special Issue> FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-09-30
著者
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SOYAMA Nobuyuki
Mitsubishi Materials Corporation, Development Section, Sanda Plant
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OGI Katsumi
Mitsubishi Materials Corporation, Central Research Institute
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OGI Katsumi
Central Research Institute, Mitsubishi Materials Corporaltion
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DOI Hidekazu
Department of Information Science, Faculty of Science, Kanagawa University
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Sasaki Go
Central Research Institute Mitsubishi Materials Corporation
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Ogi K
Mitsubishi Materials Corporation Central Research Institute
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Doi Hidekazu
Department Of Information Science Faculty Of Science Kanagawa University
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YONEZAWA Tadashi
Central Research Institute, Mitsubishi Materials Corporation
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ATSUKI Tsutomu
Central Research Institute, Mitsubishi Material Corporation
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Atsuki T
Mitsubishi Materials Corporation Central Research Institute
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Atsuki Tsutomu
Central Research Institute Mitsubishi Materials Corporation
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SOYAMA Nobuyuki
Central Research Institute, Mitsubishi Materials Corporation
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Soyama Nobuyuki
Mitsubishi Materials Corporation Development Section Sanda Plant
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Yonezawa T
Mitsubishi Materials Corp. Omiya Jpn
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Yonezawa Tadashi
Central Research Institute Mitsubishi Materials Corporation
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Sasaki Go
Laboratory Of Cellular Neurobiology School Of Life Science Tokyo University Of Pharmacy And Life Sci
関連論文
- Low-Temperature Crystallization of Sol-Gel Derived Pb(Zr_,Ti_)O_3 Thin Films
- Preparation and Evaluation of Pb(Zr, Ti)O_3 Thin Films for Low Voltage Operation
- Evaluation of Pb(Zr, Ti)O_3 Films Derived from Propylene-Glycol-Based Sol-Gel Solutions
- Photon-Stimulated Desorption Mechanism of Cl^+ Ions from Cl/Si(111) Surface
- Influence of Buffer Layer Insertion and Annealing Mode upon Microstructures and Ferroelectric Characteristics of Sol-Gel-Derived Pb(Zr_x, Ti_)O_3 Thin Films
- Ultrasonic Properties of Lead Zirconate Titanate Thin Films in UHF-SHF Range
- New Low Temperature Processing of Sol-Gel SrBi_2Ta_2O_9 Thin Films
- Influence of Buffer Layers and Excess Pb/Zr+Ti Ratios on Fatigue Characteristics of Sol-Gel-Derived Pb(Zr, Ti)O_3 Thin Films
- Evaluation of Self-Patterned PbZr_xTi_O_3 Thin Film from Photosensitive Solution
- Preparation of Bi-Based Ferroelectric Thin Films by Sol-Gel Method
- Preparation of Dielectric Thin Films from Photosensitive Sol-Gel Solution ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Study on Pb-Based Ferroelectric Thin Films Prepared by Sol-Gel Method for Memory Application ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Surface Morphology of Lead-Based Thin Films and Their Properties ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Influence of Buffer Layers on Microstructural and Ferroelectric Characteristics of Sol-Gel Derived PbZr_xTiO_3 Thin Films ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
- Preparation of Pb(Zr,Ti)O_3 Films on Pi/Ti/Ta Electrodes by Sol-Get Process
- Micro-Patterning of PbZr_xTi_O_3 Thin Films Prepared by Photo Sensitive Sol-Get Solution
- Characteristics and Ferroelectric Properties of Pb(Zr, Ti)O_3 Capacitors with Pt/La_Sr_Co_O_3 Top and La_Sr_Co_O_3/SrTiO_3/Pt/SrTiO_3 Bottom Electrodes
- The Orientation and Grain Texture Effect on Life Time Reliability of Sol--Gel Derived PbZr0.52Ti0.48O3 Films