Influence of Buffer Layers and Excess Pb/Zr+Ti Ratios on Fatigue Characteristics of Sol-Gel-Derived Pb(Zr, Ti)O_3 Thin Films

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1995-09-30

著者

• DOI Hidekazu

  Department of Information Science, Faculty of Science, Kanagawa University

• Doi Hidekazu

  Department Of Information Science Faculty Of Science Kanagawa University

• ATSUKI Tsutomu

  Central Research Institute, Mitsubishi Material Corporation

• Atsuki Tsutomu

  Central Research Institute Mitsubishi Materials Corporation

関連論文

• Influence of Buffer Layer Insertion and Annealing Mode upon Microstructures and Ferroelectric Characteristics of Sol-Gel-Derived Pb(Zr_x, Ti_)O_3 Thin Films
• New Low Temperature Processing of Sol-Gel SrBi_2Ta_2O_9 Thin Films
• Influence of Buffer Layers and Excess Pb/Zr+Ti Ratios on Fatigue Characteristics of Sol-Gel-Derived Pb(Zr, Ti)O_3 Thin Films
• Influence of Buffer Layers on Microstructural and Ferroelectric Characteristics of Sol-Gel Derived PbZr_xTiO_3 Thin Films ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
• Preparation of Pb(Zr,Ti)O_3 Films on Pi/Ti/Ta Electrodes by Sol-Get Process
• Characteristics and Ferroelectric Properties of Pb(Zr, Ti)O_3 Capacitors with Pt/La_Sr_Co_O_3 Top and La_Sr_Co_O_3/SrTiO_3/Pt/SrTiO_3 Bottom Electrodes

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