The Orientation and Grain Texture Effect on Life Time Reliability of Sol--Gel Derived PbZr0.52Ti0.48O3 Films

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概要

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• We fabricated Pb(Zr,Ti)O3 (PZT) films with different orientations and grain textures by the sol--gel method. The fabricated films were tested using the high accelerated lifetime testing system. As a result, films with coarse grain texture exhibited longer lifetimes and a higher acceleration factor than those with fine-grained texture. The film orientation did not affect the mean time to failure of the film. This suggests that breaking phenomena are strongly dependent on the number of grain boundaries.

• 2012-09-25

著者

• SOYAMA Nobuyuki

  Central Research Institute, Mitsubishi Materials Corporation

• Noguchi Takashi

  Central Research Laboratory Mitsubishi Electric Corporation

• Fuji Jun

  Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan

• Doi Toshihiro

  Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan

• Sakurai Hideaki

  Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan

• Soyama Nobuyuki

  Central Research Institute, Mitsubishi Materials Corporation, Naka, Ibaraki 311-0102, Japan

関連論文

• Shapiro Steps in Small-Area SIS Junction at 70 GHz and 140 GHz
• Influence of Buffer Layers on Microstructural and Ferroelectric Characteristics of Sol-Gel Derived PbZr_xTiO_3 Thin Films ( FERROELECTRIC MATERIALS AND THEIR APPLICATIONS)
• Preparation of Pb(Zr,Ti)O_3 Films on Pi/Ti/Ta Electrodes by Sol-Get Process
• Planar DC SQUID with a Damping Resistor
• Pair and Quasiparticle Tunnelings in Arrays of SIS Junctions Observed by Radio Frequency Noise
• The Orientation and Grain Texture Effect on Life Time Reliability of Sol--Gel Derived PbZr0.52Ti0.48O3 Films

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