Transient Response Simulation of Semiconductor Diodes with Deep Impurity Levels
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1979-04-05
著者
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NAGAI Masaaki
Department of Earth and Space Science, Graduate School of Science, Osaka University
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Shibata Yukio
Department Of Electronic Engineering Tohoku University
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YAMAMOTO Takayuki
Department of Electronics, Faculty of Engineering, Tottori University
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Nagai Masaaki
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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HARIU Takashi
Department of Electronic Engineering, Faculty of Engineering, Tohoku University
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Shibata Yukio
Department Of Computer Science Faculty Of Engineering Gunma University
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Hariu Takashi
Department Of Electrical Engineering Tohoku University
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Yamamoto Takayuki
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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Nagai Masaaki
Department Of Earth And Space Science Graduate School Of Science Osaka University
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NAGAI Masaaki
Department of Earth & Space Science, Osaka University
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YAMAMOTO Takayuki
Department of Communications and Integrated Systems, Tokyo Institute of Technology
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Yamamoto Takayuki
Department of Applied Chemistry, Faculty of Science and Engineering, Kinki University
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